Failure Prognosis of High Voltage Circuit Breakers with Temporal Latent Dirichlet Allocation †
Abstract
:1. Introduction
- (1)
- Weak correlation. The underlying hypothesis behind association-based sequence mining, especially for the rule-based methods, is the strong correlation between events. In contrast, the dependency of the failures on HVCBs is much weaker and probabilistic.
- (2)
- Complexity. The primary objective of most existing applications is a binary decision: whether a failure will happen or not. However, accurate life-cycle management requires information about which failure might occur. The increasing complexity of encoding categories into sequential values can impose serious challenges on the analysis method design, which is called the “curse of cardinality”.
- (3)
- Sparsity. Despite the cardinality problem, the types of failure occurring on an individual basis is relatively small. Some events in a single case may have never been observed before, which makes establishing a statistical significance challenging. The inevitable truncation also aggravates the sparsity problem to a higher degree.
2. Data Preprocessing
2.1. Description of the HVCB Event Logs
2.2. Failure Classification
2.3. Sequence Aligning and Spatial Compression
3. Proposed Method
3.1. Latent Dirichlet Allocation Model
3.1.1. Dirichlet Distribution
- (1)
- Choose , where ;
- (2)
- Choose a failure , where .
3.1.2. Latent Layer
3.1.3. Latent Dirichlet Allocation
- (1)
- Choose , where ;
- (2)
- Choose , where ;For each failure ,
- (3)
- Choose a latent value ;
- (4)
- Choose a failure .
3.2. Introducing the Temporal Association into LDA
Algorithm 1 Gibbs sampling with the new co-occurrence patterns | |
Input: Sequences, MaxIteration, , , , | |
Output: posterior inference of and | |
1: | Initialization: randomly assign failure patterns and make sub-sequences by ; |
2: | Compute the statistics , , , in Equation (11) for each sub-sequence; |
3: | for iter in 1 to MaxIteration do |
4: | Foreach sequence in Sequences do |
5: | Foreach sub-sequence in sequence do |
6: | Add new failures in the current sub-sequence based on Equation (16); |
7: | Foreach failure in the new sub-sequence do |
8: | Draw new from Equation (11); |
9: | Update the statistics in Equation (11); |
10: | End for |
11: | End for |
12: | End for |
13: | Compute the posterior mean of and based on Equations (12) and (13) |
14: | End for |
15: | Compute the mean of and of last several iterations |
4. Evaluation Criteria
4.1. Quantitative Criteria
4.1.1. Top-N Recall
4.1.2. Overlapping Probability
4.2. Qualitative Criteria
5. Case Study
5.1. Quantitative Analysis
5.1.1. Parameter Analysis
5.1.2. Comparison with Baselines
5.2. Qualitative Analysis
5.2.1. Failure Patterns Extraction
5.2.2. Temporal Features of the Failure Patterns
5.2.3. Similarities between Failures
6. Conclusions and Future Work
Acknowledgments
Author Contributions
Conflicts of Interest
References
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Attribute | Content |
---|---|
ID | Numerical order of a failure entry |
Voltage grade | 110 kV, 220 kV, or 550 kV |
Substation | Location of the equipment failure, e.g., ShenZhen station |
Product model | Specified model number, e.g., JWG1-126 |
Equipment type | A board taxonomy, e.g., high-voltage isolator, gas insulated switchgear (GIS) |
Failure description | Detailed description of the phenomena observed |
Failure reason | Cause of the failure |
Failure time | Time when a failure was recorded |
Processing measures | Performed operation to repair the high voltage circuit breaker (HVCB) |
Processing result | Performance report after repair |
Repair time | Time when a failure was removed |
Installing time | Time when a HVCB was first put into production |
Others | Including the person responsible, mechanism type, a rough classification, manufacturers, etc. |
Failure Description | Failure Reason | Processing Measures |
---|---|---|
Circuit breakers connected with the high voltage side of the main transformer cannot close or open. The power supply runs faultlessly during inspection | Bad manufacturing quality | Replace the electromotor |
Performance Criteria | W (Years) | (Days) |
---|---|---|
Top-1 | 7 | 30,000 |
Top-5 | 7 | 20,000 |
Top-10 | 3 | 10,000 |
Overlapping Probability | 7 | 30,000 |
Method | Top-1 (%) | Top-5 (%) | Top-10 (%) | (%) |
---|---|---|---|---|
TLDA | 51.13 | 73.86 | 92.93 | 31.50 |
Statistical Approach | 19.79 | 58.33 | 78.12 | 5.87 |
Bayesian Sequential Method | 41.67 | 55.21 | 65.63 | 33.96 |
Neural Network(LSTM) | 32.29 | 67.70 | 81.25 | 15.52 |
1. Operation Error by Machinery Parts | 2. Operation Error by Driving System | 3. Operation Error by Tripping Coils | 4. Cubicles and Its Auxiliary System |
Operating mechanism Assistive component damage High voltage indicating device SF6 leakage Electromotor stalling Travel switch | Electromotor stalling Travel switch Relay Reason Unidentified Electromotor on file Safe-blocked circuit Closing instruction Operating mechanism | Tripping and closing coil Secondary cubicle Operating mechanism Humidity ovenproof Mechanism cubicle Safe-blocked circuit | Mechanism cubicle High temperature Secondary cubicle Insulator Closing instructions Auxiliary switch Incomplete installation High voltage indicating device Operating mechanism Travel switch |
5. SF6 Leakage | 6. Operation Error by Secondary System | 7. Pneumatic Mechanism | 8. Measuring System |
SF6 leakage | Remote control signal Auxiliary switch Rejecting action Operating mechanism Tripping and closing coil Gas pressure meter | Pneumatic mechanism leakage Poor contact Misjudgment Air compressor stalling Air compressor leakage Mechanism cubicle SF6 leakage Remote control signal Relay Electromotor stalling | Closing instructions High voltage indicating device Operation counter False wring Transmission bar Operating mechanism SF6 leakage Gas pressure meter SF6 constituents Tripping and closing coil |
9. Secondary System | 10. Hydraulic Mechanism | ||
Contactor Safe-blocked circuit Air compressor stalling Main circuit High voltage indicating device SF6 constituents False wring Contactor | Hydraulic mechanism leakage Closing instructions SF6 leakage Operating mechanism |
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Li, G.; Wang, X.; Yang, A.; Rong, M.; Yang, K. Failure Prognosis of High Voltage Circuit Breakers with Temporal Latent Dirichlet Allocation. Energies 2017, 10, 1913. https://doi.org/10.3390/en10111913
Li G, Wang X, Yang A, Rong M, Yang K. Failure Prognosis of High Voltage Circuit Breakers with Temporal Latent Dirichlet Allocation. Energies. 2017; 10(11):1913. https://doi.org/10.3390/en10111913
Chicago/Turabian StyleLi, Gaoyang, Xiaohua Wang, Aijun Yang, Mingzhe Rong, and Kang Yang. 2017. "Failure Prognosis of High Voltage Circuit Breakers with Temporal Latent Dirichlet Allocation" Energies 10, no. 11: 1913. https://doi.org/10.3390/en10111913
APA StyleLi, G., Wang, X., Yang, A., Rong, M., & Yang, K. (2017). Failure Prognosis of High Voltage Circuit Breakers with Temporal Latent Dirichlet Allocation. Energies, 10(11), 1913. https://doi.org/10.3390/en10111913