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Journal: Materials, 2017
Volume: 10
Number: 680

Article: Bias Stress and Temperature Impact on InGaZnO TFTs and Circuits
Authors: by Jorge Martins, Pydi Bahubalindruni, Ana Rovisco, Asal Kiazadeh, Rodrigo Martins, Elvira Fortunato and Pedro Barquinha
Link: https://www.mdpi.com/1996-1944/10/6/680

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