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Journal: Materials, 2018
Volume: 11
Number: 2502

Article: A Comparative Study of E-Beam Deposited Gate Dielectrics on Channel Width-Dependent Performance and Reliability of a-IGZO Thin-Film Transistors
Authors: by Gwomei Wu, Anup K. Sahoo, Dave W. Chen and J. W. Chang
Link: https://www.mdpi.com/1996-1944/11/12/2502

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