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Journal: Materials, 2018
Volume: 11
Number: 979

Article: An Approach for Measuring the Dielectric Strength of OLED Materials
Authors: by Sujith Sudheendran Swayamprabha, Deepak Kumar Dubey, Wei-Chi Song, You-Ting Lin, Rohit Ashok Kumar Yadav, Meenu Singh and Jwo-Huei Jou
Link: https://www.mdpi.com/1996-1944/11/6/979

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