Zhu, S.; Wu, Y.; Li, Z.; Fang, L.; Yin, A.; Yan, J.; Jiang, F.; Meng, X.; Chen, P.; Cai, Z.
Fretting Wear Behavior and Photoelectron Spectroscopy (XPS) Analysis of a Ti/TiN Multilayer Film Deposited on Depleted Uranium. Materials 2018, 11, 1538.
https://doi.org/10.3390/ma11091538
AMA Style
Zhu S, Wu Y, Li Z, Fang L, Yin A, Yan J, Jiang F, Meng X, Chen P, Cai Z.
Fretting Wear Behavior and Photoelectron Spectroscopy (XPS) Analysis of a Ti/TiN Multilayer Film Deposited on Depleted Uranium. Materials. 2018; 11(9):1538.
https://doi.org/10.3390/ma11091538
Chicago/Turabian Style
Zhu, Shengfa, Yanping Wu, Zhengyang Li, Liping Fang, Anyi Yin, Jiawei Yan, Fan Jiang, Xiandong Meng, Piheng Chen, and Zhenbing Cai.
2018. "Fretting Wear Behavior and Photoelectron Spectroscopy (XPS) Analysis of a Ti/TiN Multilayer Film Deposited on Depleted Uranium" Materials 11, no. 9: 1538.
https://doi.org/10.3390/ma11091538
APA Style
Zhu, S., Wu, Y., Li, Z., Fang, L., Yin, A., Yan, J., Jiang, F., Meng, X., Chen, P., & Cai, Z.
(2018). Fretting Wear Behavior and Photoelectron Spectroscopy (XPS) Analysis of a Ti/TiN Multilayer Film Deposited on Depleted Uranium. Materials, 11(9), 1538.
https://doi.org/10.3390/ma11091538