Order Article Reprints

Wan L, He F, Qin Y, Lin Z, Su J, Chang J, Hao Y. Effects of Interfacial Passivation on the Electrical Performance, Stability, and Contact Properties of Solution Process Based ZnO Thin Film Transistors. Materials. 2018; 11(9):1761. https://doi.org/10.3390/ma11091761

Wan, Liaojun, Fuchao He, Yu Qin, Zhenhua Lin, Jie Su, Jingjing Chang, and Yue Hao. 2018. "Effects of Interfacial Passivation on the Electrical Performance, Stability, and Contact Properties of Solution Process Based ZnO Thin Film Transistors" Materials 11, no. 9: 1761. https://doi.org/10.3390/ma11091761

Wan, L., He, F., Qin, Y., Lin, Z., Su, J., Chang, J., & Hao, Y. (2018). Effects of Interfacial Passivation on the Electrical Performance, Stability, and Contact Properties of Solution Process Based ZnO Thin Film Transistors. Materials, 11(9), 1761. https://doi.org/10.3390/ma11091761