Thuau, D.; Begley, K.; Dilmurat, R.; Ablat, A.; Wantz, G.; Ayela, C.; Abbas, M.
Exploring the Critical Thickness of Organic Semiconductor Layer for Enhanced Piezoresistive Sensitivity in Field-Effect Transistor Sensors. Materials 2020, 13, 1583.
https://doi.org/10.3390/ma13071583
AMA Style
Thuau D, Begley K, Dilmurat R, Ablat A, Wantz G, Ayela C, Abbas M.
Exploring the Critical Thickness of Organic Semiconductor Layer for Enhanced Piezoresistive Sensitivity in Field-Effect Transistor Sensors. Materials. 2020; 13(7):1583.
https://doi.org/10.3390/ma13071583
Chicago/Turabian Style
Thuau, Damien, Katherine Begley, Rishat Dilmurat, Abduleziz Ablat, Guillaume Wantz, Cédric Ayela, and Mamatimin Abbas.
2020. "Exploring the Critical Thickness of Organic Semiconductor Layer for Enhanced Piezoresistive Sensitivity in Field-Effect Transistor Sensors" Materials 13, no. 7: 1583.
https://doi.org/10.3390/ma13071583
APA Style
Thuau, D., Begley, K., Dilmurat, R., Ablat, A., Wantz, G., Ayela, C., & Abbas, M.
(2020). Exploring the Critical Thickness of Organic Semiconductor Layer for Enhanced Piezoresistive Sensitivity in Field-Effect Transistor Sensors. Materials, 13(7), 1583.
https://doi.org/10.3390/ma13071583
