Applications of AOTF Spectrometers in In Situ Lunar Measurements
Abstract
:1. Introduction
2. Lunar In Situ Spectrometers
2.1. VNIS on Board Chang’e-3 and Chang’e-4
2.2. LMS on Board Chang’e-5
3. Main Characteristics of the AOTFs in VNIS and LMS
3.1. AOTFs on Chang’e-3/4 and Their Indicators
3.2. AOTFs on Chang’e-5 and Their Indicators
4. Application Results of Lunar In situ Spectrometers
4.1. Application Results of VNIS on Board Chang’e-3
4.2. Application Results of VNIS on Board Chang’e-4
4.3. Application Effects of LMS on Board Chang’e-5
5. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
References
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Parameters | VNIS/Chang’e-3 | VNIS/Chang’e-4 | LMS/Chang’e-5 | |||
---|---|---|---|---|---|---|
VIS-NIR | SWIR | VIS-NIR | SWIR | VIS-NIR | IR | |
Spectral coverage/nm | 449–950 | 900–2400 | 450–950 | 900–2400 | 480–1450 | 1400–3200 |
Spectral resolution/nm | 2–7 | 3–12 | 2.4–6.5 | 3.6–9.5 | 2.4–9.4 | 7.6–24.9 |
FOV/deg | 8.5 × 8.5 | ø3.6 | 8.5 × 8.5 | ø3.6 | 4.17 × 4.17 | 4.17 × 4.17 |
Effective pixels | 256 × 256 | 1 | 256 × 256 | 1 | 256 × 256 | 1 |
Quantization/bits | 10 | 16 | 10 | 16 | 10 | 16 |
SNR/dB | ≥31@ albedo is 9% and solar incident angle is 45° | ≥32@ albedo is 9% and solar incident angle is 75° | ≥33@ albedo is 9% and solar incident angle is 45° | ≥31@ albedo is 9% and solar incident angle is 75° | ≥34@ albedo is 9% and solar incident angle is 45° | ≥39@ albedo is 9% and solar incident angle is 45° |
Sampling interval/nm | 5 | 5 | 5 | |||
Power/w | 19.8 | 16.95 | 15.17 | |||
Weight/kg | 4.675/probe ~0.7/electronics | 4.675/probe ~0.7/electronics | ≤5.57 | |||
Operating temperture | −20 °C~+55 °C | −20 °C~+55 °C | −25 °C~+65 °C |
Parameters | VNIS/Chang’e-3 | VNIS/Chang’e-4 | LMS/Chang’e-5 | |||
---|---|---|---|---|---|---|
VIS-NIR | SWIR | VIS-NIR | SWIR | VIS-NIR | IR | |
Material | TeO2 | TeO2 | TeO2 | TeO2 | TeO2 | TeO2 |
Spectral coverage/nm | 449–950 | 899–2402 | 450–950 | 900–2400 | 480–1450 | 1400–3200 |
FWHM/nm | 2.3–6.3 @ < 630 nm 2.4–6.8 @ > 630 nm | 3.1–8.9 @ < 1380 nm 4.4–11.6 @ > 1380 nm | 2.0–5.8 @ < 630 nm 2.8–6.4 @ > 630 nm | 3.75–8.4 @ < 1380 nm 4.2–9.6 @ > 1380 nm | 2.6–9.4 @ < 780 nm 2.4–9.0 @ > 780 nm | 7.6–20.8 @ 1400–2300 nm 11.6–24.9 @ 2200–3200 nm |
RF/MHz | 70.7–178.6 | 41.9–118.9 | 71.2–178.7 | 42.0–118.8 | 45.2–163.6 | 27.7–66.2 |
Angular aperture/° | >7 | >8 | >7 | >8 | >7 | >3 |
Diffraction angle/° | >5.6 | >7.5 | >5.6 | >7.5 | >5.6 | >7 |
Power/W | ~2 | ~2 | ~2 |
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Li, J.; Gui, Y.; Xu, R.; Zhang, Z.; Liu, W.; Lv, G.; Wang, M.; Li, C.; He, Z. Applications of AOTF Spectrometers in In Situ Lunar Measurements. Materials 2021, 14, 3454. https://doi.org/10.3390/ma14133454
Li J, Gui Y, Xu R, Zhang Z, Liu W, Lv G, Wang M, Li C, He Z. Applications of AOTF Spectrometers in In Situ Lunar Measurements. Materials. 2021; 14(13):3454. https://doi.org/10.3390/ma14133454
Chicago/Turabian StyleLi, Jinning, Yuhua Gui, Rui Xu, Zehong Zhang, Wei Liu, Gang Lv, Meizhu Wang, Chunlai Li, and Zhiping He. 2021. "Applications of AOTF Spectrometers in In Situ Lunar Measurements" Materials 14, no. 13: 3454. https://doi.org/10.3390/ma14133454