Parasitic Current Induced by Gate Overlap in Thin-Film Transistors
Abstract
:1. Introduction
2. Devices and Experiment
3. Results and Discussion
4. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
References
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Lee, H.-J.; Abe, K.; Kim, J.-S.; Yun, W.S.; Lee, M.-J. Parasitic Current Induced by Gate Overlap in Thin-Film Transistors. Materials 2021, 14, 2299. https://doi.org/10.3390/ma14092299
Lee H-J, Abe K, Kim J-S, Yun WS, Lee M-J. Parasitic Current Induced by Gate Overlap in Thin-Film Transistors. Materials. 2021; 14(9):2299. https://doi.org/10.3390/ma14092299
Chicago/Turabian StyleLee, Hyeon-Jun, Katsumi Abe, June-Seo Kim, Won Seok Yun, and Myoung-Jae Lee. 2021. "Parasitic Current Induced by Gate Overlap in Thin-Film Transistors" Materials 14, no. 9: 2299. https://doi.org/10.3390/ma14092299