Xu, K.; Fu, X.; Wang, X.; Fu, Z.; Yang, X.; Chen, S.; Shi, Y.; Huang, Y.; Chen, H.
The Effect of Grain Orientation of β-Sn on Copper Pillar Solder Joints during Electromigration. Materials 2022, 15, 108.
https://doi.org/10.3390/ma15010108
AMA Style
Xu K, Fu X, Wang X, Fu Z, Yang X, Chen S, Shi Y, Huang Y, Chen H.
The Effect of Grain Orientation of β-Sn on Copper Pillar Solder Joints during Electromigration. Materials. 2022; 15(1):108.
https://doi.org/10.3390/ma15010108
Chicago/Turabian Style
Xu, Kexin, Xing Fu, Xinjie Wang, Zhiwei Fu, Xiaofeng Yang, Si Chen, Yijun Shi, Yun Huang, and Hongtao Chen.
2022. "The Effect of Grain Orientation of β-Sn on Copper Pillar Solder Joints during Electromigration" Materials 15, no. 1: 108.
https://doi.org/10.3390/ma15010108
APA Style
Xu, K., Fu, X., Wang, X., Fu, Z., Yang, X., Chen, S., Shi, Y., Huang, Y., & Chen, H.
(2022). The Effect of Grain Orientation of β-Sn on Copper Pillar Solder Joints during Electromigration. Materials, 15(1), 108.
https://doi.org/10.3390/ma15010108