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Communication

A DFT-Based Descriptor to Predict the Water Vapor Corrosion Resistance of Rare-Earth Monosilicates

1
State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 201899, China
2
College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100049, China
*
Author to whom correspondence should be addressed.
Materials 2022, 15(7), 2414; https://doi.org/10.3390/ma15072414
Submission received: 26 February 2022 / Revised: 18 March 2022 / Accepted: 21 March 2022 / Published: 25 March 2022
(This article belongs to the Section Materials Simulation and Design)

Abstract

:
Rare-earth monosilicates are used as environmental barrier coatings (EBCs) due to their excellent water vapor corrosion resistance. However, existing experimental studies on the water vapor corrosion behavior of rare-earth monosilicates are discrepant and even contradictory. Previous theoretical investigations on water vapor corrosion resistance mainly focus on a Mulliken analysis of Si-O bonds in the monosilicates. In this study, the structural and electronic properties of rare-earth monosilicates have been studied by density functional theory (DFT) calculations, and a descriptor correlated to the corrosion resistance has been developed. The maximum isosurface value of the valence band maximum (VBMFmax) can be used to predict the water vapor corrosion resistance of RE2SiO5. The results show that RE2SiO5 with a smaller VBMFmax may have better water vapor corrosion resistance.

1. Introduction

Rare-earth (RE) silicates are promising candidates for environmental barrier coatings (EBCs) due to their exceptional high-temperature durability, chemical compatibility and water vapor corrosion resistance [1]. Rare-earth monosilicates, RE2SiO5, have two types of monoclinic crystalline structures: RE2SiO5 with a space group of P21/c are called X1 phase when the ionic radius of RE elements (RE = La~Gd) is larger, while the X2 phase with a C2/c space group forms by the elements from Tb to Lu [2]. The water vapor corrosion behaviors and mechanisms may be different between the two phases.
Recently, many experimental studies have been carried out regarding the water vapor corrosion resistance of RE2SiO5 as EBCs. Wang et al. [3] found that X2-RE2SiO5 are more stable than X1-RE2SiO5 in high-temperature water steam. Nasiri et al. [4] investigated the water vapor corrosion resistance of RE2SiO5 (RE = Y, Gd, Er, Yb and Lu) in air with 90% water, and found that their water vapor resistance has the following order: Y2SiO5 > Er2SiO5 > Yb2SiO5 > Lu2SiO5 > Gd2SiO5. Klemm et al. [5] studied the water vapor corrosion resistance of Y2SiO5 and Sc2SiO5, indicating that Y2SiO5 exhibited better water vapor corrosion resistance. Unfortunately, the existing experimental studies on the water vapor corrosion behavior of rare-earth monosilicates may be discrepant or even contradictory due to the different experimental conditions [6]. It is worth pointing out that the water vapor corrosion resistance of rare-earth monosilicates can also be evaluated by theoretical calculations. For example, Han et al. [7] studied the water vapor corrosion resistance of X2-RE2SiO5 (RE = Lu, Yb, Tm, Er, Ho, Dy, Y and Sc) using first-principles calculations. They concluded that the water vapor corrosion resistance of X2-RE2SiO5 demonstrated the following order: Sc2SiO5 > Dy2SiO5 > Y2SiO5 > Ho2SiO5 > Er2SiO5 > Yb2SiO5 > Tm2SiO5 > Lu2SiO5, which shows some disagreement with the experimental findings [3,5,6]. Therefore, it is still a challenge to provide a precise order of the water vapor corrosion resistance of RE2SiO5.
In previous theoretical studies [7,8], researchers mainly focused on the Si-O bonds instead of RE-O bonds of rare-earth silicates to compare their water vapor corrosion resistances. However, the [REOx] polyhedron is less rigid than the [SiO4] tetrahedral, and is easier to collapse and react with water molecules. In this work, we used density functional theory (DFT) calculations to investigate the water vapor corrosion resistance of RE2SiO5 through RE-O bonds. By comparing the structural and electronic properties of RE2SiO5, we have developed a descriptor, i.e., the maximum isosurface value of the valence band maximum (VBMFmax), to predict their water vapor corrosion resistances.

2. Materials and Methods

All DFT calculations were performed using the Vienna Ab initio Simulation Package (VASP) [9]. The projector augmented-wave (PAW) method and plane-wave basis sets are used [10,11]. The Perdew–Burke–Ernzerhof (PBE) potential is adopted to treat exchange–correlation interactions at the generalized gradient approximation (GGA) level [12]. The cut-off energy for the plane-wave basis was set to 520 eV throughout the present study. The k-point sampling of the Brillouin zone is based on the Monkhorst–Pack method [13]. A 3 × 4 × 4 k-point grid and a 2 × 5 × 3 k-point grid were used for X1-RE2SiO5 and X2-RE2SiO5, respectively. The crystal structures were completely optimized by the lattice parameters and internal atomic coordinates until the total energy difference and the forces on atoms were less than 1.0 × 10−6 eV and 0.01 eV/Å, respectively. Visualizations of all the structures were performed using VESTA [14].

3. Results and Discussion

3.1. Crystal Structure of RE2SiO5

The calculated lattice parameters of RE2SiO5 and the experimental data are compared in Table 1, and the 1% disagreement suggests that the optimized structures are reasonable. The crystal structures of X1- and X2-RE2SiO5 are shown in Figure 1a,b. The unit cell of RE2SiO5 contains 32 atoms, including two different RE sites (labeled as RE1 and RE2), one Si site and five different O sites (labeled as O1–O5). The four O positions of O1–O4 form a Si-centered tetrahedron [SiO4], while O5 atoms only loosely bond with rare-earth atoms [2]. The difference between X1-RE2SiO5 and X2-RE2SiO5 lies in the coordination number of rare-earth atoms, ranging from nine to seven and seven to six [2]. Figure 1c shows the energy difference between the X1 phase and X2 phase for the same RE2SiO5. The increasing energy difference indicates that the structural stability of the X1 phase decreases with the increasing ionic radius of RE atoms; RE elements tend to more often form X2-RE2SiO5 with an increase in the ionic radius of RE atoms [15].
When exposed to water-vapor-containing environments, RE2SiO5 will suffer from rapid recession, eventually generating Si(OH)4 and RE(OH)3 gas [3,6]. Generally, the [REOx] polyhedron is less rigid than the [SiO4] tetrahedral, and the RE-O bonds tend to show different bonding properties for different rare-earth monosilicates. As shown in Figure 2, we found that the radial distribution functions, g(r), of Si-O bonds remained unchanged, while the distribution of RE-O bonds changed remarkably in both X1- and X2-RE2SiO5. Therefore, the difference in the water vapor corrosion resistance should be closely related to the changing RE-O bonds and their electronic structures.

3.2. The Valence Band Maximum (VBM) of RE2SiO5

Chemical reactivity can be related to the highest occupied molecular orbital (HOMO) and lowest unoccupied molecular orbital (LUMO) characteristics in molecules, while in bulk materials it can be described by the valence band maximum (VBM) and the conduction band minimum (CBM) [22]. Previously, we [23] investigated the hydration sensitivity of triclinic tricalcium silicate by a combination of DFT calculations and molecular dynamics. We found that the long-term reaction with water molecules is controlled by the proton transport of silicate, and can be intrinsically related to the valence band maximum of the bulk solid. Similarly, for the corrosion behaviors induced by water vapor, the valance band maximum (VBM) of the bulk solid could be used as a descriptor to estimate the water-related corrosion resistance.
Figure 3 shows the partial charge density at the VBM of X1-RE2SiO5. The partial charge density at the VBM only exists at the sites of O atoms, suggesting that O atoms would experience an electrophilic attack. Interestingly, the charge densities distributions of X1-RE2SiO5 are almost unchanged for RE = La, Pr, Nd and Sm, and are mainly located around O5 atoms. However, Gd2SiO5 shows a completely different profile, where the charge densities are mainly located around O1–O4 atoms. O5 atoms bond with RE much more loosely when compared with the O1–O4 atoms bonding with Si atoms [2]. This may suggest that Gd2SiO5 is much more stable when reacting with water vapor, indicating that Gd2SiO5 has better water vapor corrosion resistance. The localization of the valence band maximum in RE2SiO5 can be related to the water vapor corrosion resistance, and the maximum isosurface value of the valence band maximum (VBMFmax) can be used to describe the electronic localization of RE2SiO5 [23]. As listed in Table 2, the VBMFmax of Gd2SiO5 is much smaller than that of other X1-RE2SiO5 (RE = La, Pr, Nd, Sm and Eu). More specifically, the VBMFmax of X1-RE2SiO5 ranks as Pr2SiO5 > La2SiO5 > Nd2SiO5 > Sm2SiO5 > Eu2SiO5 > Gd2SiO5. Such a decreasing VBMFmax value corresponds with an increasing water vapor corrosion resistance, implying that Gd2SiO5 has the best water vapor corrosion resistance among X1-RE2SiO5.
For the X2-RE2SiO5 (RE = Tb, Dy, Ho, Er, Tm, Lu, Sc and Y) compounds, their VBMFmax is also analyzed, as shown in Figure 4. It is worth pointing out that the charge densities distributions of X2-RE2SiO5 are almost unchanged for RE = Tb, Dy, Ho, Er, Tm, Lu and Y. However, Sc2SiO5 shows a slightly different profile, where the charge densities around O atoms are a little more than those of other X2-RE2SiO5. This could imply that Sc2SiO5 is less stable when reacting with water vapor, indicating that Sc2SiO5 has worse water vapor corrosion resistance. Both Y2SiO5 and Er2SiO5 have a smaller value of the VBMFmax than that of Gd2SiO5, indicating that Gd2SiO5 has worse water vapor corrosion resistance. This is in agreement with the experimental outcomes of Wang et al. [3]. On the basis of the trend in Figure 3c, Y2SiO5 has better water vapor corrosion resistance than Sc2SiO5, which is consistent with what Klemm et al. concluded [5]. The decreasing order of RE2SiO5 (RE = Y, Er and Lu) in our results may also provide an explanation for the experimental results conducted by Nasiri et al. [4]. Additionally, we can conclude that the water vapor corrosion resistance of X2-RE2SiO5 has the following order: Tb2SiO5 > Dy2SiO5 > Y2SiO5 > Ho2SiO5 > Er2SiO5 > Tm2SiO5 > Lu2SiO5 > Sc2SiO5.

4. Conclusions

The water vapor corrosion resistance of RE2SiO5 (RE = La, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Lu, Sc and Y) was studied based on DFT calculations. A DFT-based descriptor, the maximum isosurface value of the valence band maximum (VBMFmax), was developed to predict the corrosion resistance for both X1- and X2-RE2SiO5. According to the proposed descriptor, it was found that Gd2SiO5 had the best water vapor corrosion resistance in X1-RE2SiO5 and that the water vapor corrosion resistance of X2-RE2SiO5 has the following order: Tb2SiO5 > Dy2SiO5 > Y2SiO5 > Ho2SiO5 > Er2SiO5 > Tm2SiO5 > Lu2SiO5 > Sc2SiO5.

Author Contributions

Methodology, Q.W.; formal analysis, Q.W.; data curation, Q.W.; writing—original draft preparation, Q.W.; writing—review and editing, J.H.; conceptualization, J.H.; supervision, J.H.; funding acquisition, J.H. All authors have read and agreed to the published version of the manuscript.

Funding

This research was funded by the National Natural Science Foundation of China (grant no. 51971237) and the Science and Technology Committee of Shanghai Municipal (grant no. 22ZR1471400).

Institutional Review Board Statement

Not applicable.

Informed Consent Statement

Not applicable.

Data Availability Statement

The data presented in this study are available on request from the corresponding author.

Conflicts of Interest

The authors declare no conflict of interest.

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Figure 1. The crystal structure of RE2SiO5: (a) X1-RE2SiO5 and (b) X2-RE2SiO5. Si tetrahedra, RE polyhedra and O atoms are colored by blue, green and red, respectively. (c) The energy difference between the X1 phase and X2 phase for the same RE2SiO5.
Figure 1. The crystal structure of RE2SiO5: (a) X1-RE2SiO5 and (b) X2-RE2SiO5. Si tetrahedra, RE polyhedra and O atoms are colored by blue, green and red, respectively. (c) The energy difference between the X1 phase and X2 phase for the same RE2SiO5.
Materials 15 02414 g001
Figure 2. Radial distribution functions, g(r), of Si-O bonds and RE-O bonds in (a) X1-RE2SiO5 and (b) X2-RE2SiO5 compounds.
Figure 2. Radial distribution functions, g(r), of Si-O bonds and RE-O bonds in (a) X1-RE2SiO5 and (b) X2-RE2SiO5 compounds.
Materials 15 02414 g002
Figure 3. The valence band maximum (VBM) of X1-RE2SiO5. (a) X1-RE2SiO5 (RE = La, Pr, Nd and Sm). (b) Eu2SiO5. (c) Gd2SiO5. Si atoms (blue) and O atoms (red) are shown. RE atoms (RE = La, Pr, Nd and Sm) are presented by green, Eu is presented by fuchsia and Gd is presented by purple. The isosurface level is set at 0.005 e/Å.
Figure 3. The valence band maximum (VBM) of X1-RE2SiO5. (a) X1-RE2SiO5 (RE = La, Pr, Nd and Sm). (b) Eu2SiO5. (c) Gd2SiO5. Si atoms (blue) and O atoms (red) are shown. RE atoms (RE = La, Pr, Nd and Sm) are presented by green, Eu is presented by fuchsia and Gd is presented by purple. The isosurface level is set at 0.005 e/Å.
Materials 15 02414 g003
Figure 4. The valence band maximum (VBM) of X2-RE2SiO5. (a) X2-RE2SiO5 (RE = Tb, Dy, Ho, Er, Tm, Lu and Y). (b) Sc2SiO5. Si atoms (blue) and O atoms (red) are shown. RE atoms (RE = Tb, Dy, Ho, Er, Tm, Lu and Y) are presented by green and Sc is presented by light purple. The isosurface level is set at 0.001e/Å. (c) The maximum isosurface value of the valence band maximum (VBMFmax) of X2-RE2SiO5 (RE = Tb, Dy, Ho, Er, Tm, Lu, Sc and Y).
Figure 4. The valence band maximum (VBM) of X2-RE2SiO5. (a) X2-RE2SiO5 (RE = Tb, Dy, Ho, Er, Tm, Lu and Y). (b) Sc2SiO5. Si atoms (blue) and O atoms (red) are shown. RE atoms (RE = Tb, Dy, Ho, Er, Tm, Lu and Y) are presented by green and Sc is presented by light purple. The isosurface level is set at 0.001e/Å. (c) The maximum isosurface value of the valence band maximum (VBMFmax) of X2-RE2SiO5 (RE = Tb, Dy, Ho, Er, Tm, Lu, Sc and Y).
Materials 15 02414 g004
Table 1. Experimental and calculated lattice parameters of X1- and X2-RE2SiO5.
Table 1. Experimental and calculated lattice parameters of X1- and X2-RE2SiO5.
Methoda (Å)b (Å)c (Å)β (°)Volume (Å3)
La2SiO5Expt. [16]
Calc.
9.3320
9.3564
7.5088
7.7155
7.0332
7.0168
108.6790
109.0060
466.8700
478.9250
Pr2SiO5Expt. [17]
Calc.
9.2530
9.3420
7.3010
7.5586
6.9340
6.9548
108.1500
108.7720
445.1000
464.9780
Nd2SiO5Expt. [18]
Calc.
9.2295
9.3039
7.2848
7.4606
6.8744
6.9006
108.1990
108.5470
439.0800
454.1070
Sm2SiO5Expt. [17]
Calc.
9.1610
9.2362
7.1120
7.2989
6.8210
6.8096
107.5100
108.1510
424.4000
436.2150
Eu2SiO5Expt. [17]
Calc.
9.1420
9.1706
7.0540
7.2362
6.7900
6.7107
107.5300
107.7030
417.9000
424.2390
Gd2SiO5Expt. [19]
Calc.
9.1200
9.1758
7.0600
7.0566
6.7300
6.7732
107.5800
107.2030
413.0900
419.0640
Tb2SiO5Expt.
Calc.
14.3660
14.5834
6.6976
6.8319
10.3633
10.5585
122.2190
122.1380
843.5900
890.7910
Dy2SiO5Expt. [17]
Calc.
14.3800
14.5296
6.7400
6.8106
10.4200
10.5085
122.0000
122.1140
856.5000
880.7640
Ho2SiO5Expt. [17]
Calc.
14.3500
14.4802
6.7100
6.7785
10.3700
10.4563
122.2000
122.0950
843.0000
869.4740
Er2SiO5Expt. [20]
Calc.
14.3660
14.4344
6.6976
6.7503
10.3633
10.4101
122.2190
122.1120
843.5900
859.1420
Tm2SiO5Expt. [17]
Calc.
14.3020
14.3815
6.6620
6.7197
10.3130
10.3633
122.2100
122.0910
828.5000
848.4790
Lu2SiO5Expt. [21]
Calc.
14.2774
14.2753
6.6398
6.6687
10.2465
10.2827
122.2240
121.9780
821.7400
830.3420
Y2SiO5Expt.
Calc.
14.5643
14.5111
6.8354
6.8113
10.5570
10.5122
122.1320
122.0870
889.9930
880.3030
Sc2SiO5Expt.
Calc.
13.8636
13.7566
6.4838
6.4896
9.9120
10.0833
121.5360
120.8350
759.3900
772.9450
Table 2. The maximum isosurface value of the valence band maximum (VBMFmax) of X1-RE2SiO5.
Table 2. The maximum isosurface value of the valence band maximum (VBMFmax) of X1-RE2SiO5.
La2SiO5Pr2SiO5Nd2SiO5Sm2SiO5Eu2SiO5Gd2SiO5
VBMFmax(e/Å3)0.0980.0990.0970.0940.0600.053
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Wang, Q.; Huang, J. A DFT-Based Descriptor to Predict the Water Vapor Corrosion Resistance of Rare-Earth Monosilicates. Materials 2022, 15, 2414. https://doi.org/10.3390/ma15072414

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Wang Q, Huang J. A DFT-Based Descriptor to Predict the Water Vapor Corrosion Resistance of Rare-Earth Monosilicates. Materials. 2022; 15(7):2414. https://doi.org/10.3390/ma15072414

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Wang, Qianqian, and Jian Huang. 2022. "A DFT-Based Descriptor to Predict the Water Vapor Corrosion Resistance of Rare-Earth Monosilicates" Materials 15, no. 7: 2414. https://doi.org/10.3390/ma15072414

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