Digital Image Correlation for Measuring Full-Field Residual Stresses in Wire and Arc Additive Manufactured Components
Abstract
:1. Introduction
2. Experimental Methods
2.1. Feedstock Wire and Substrate Material
2.2. WAAM Process and Specimen Preparation
2.3. Residual Stress Evaluation Using Digital Image Correlation
2.3.1. The Concept
2.3.2. Assumptions for Initial Stress Field
- There is no or close-to-zero deflection in the rigidly clamped component during the WAAM deposition process. Once unclamped, the bending moment acting on the cross-section is zero [5].
- The deposited wall initially contains tensile residual stresses due to the restriction to shrinkage deformation during cooling down using rigid clamps. The longitudinal residual stress field that is initially present in a clamped component can be approximated by a constant (or uniform) stress over the height of the wall [5,58]. The magnitude of this stress depends on the thermal properties, and for steel, this can be as high as the material’s yield strength at room temperature [58]. This assumption also provides a safety margin, as equalizing to yield strength represents the worst-case scenario [5,13,59].
- In the substrate, the extent of the plastic zone is negligible in the clamped state and residual stresses are entirely compressive, with a non-continuous transition at the interface wall/substrate to balance the process-induced tensile residual stresses in the deposited wall [5].
2.3.3. DIC-Monitored Unclamping
2.4. Validation and Verification of DIC Results
- (a)
- Contour method: The contour method is a destructive residual stress measurement technique based on stress relaxation [38]. A part containing residual stress is cut into two halves, and the stress component normal to the cut surface is measured. At Coventry University, contour measurements were carried out on two specimens, one each from 24 mm and 48 mm wall height (specimen IDs 24-S2 and 48-S1). Samples were cut on a Fanuc Robocut α-C600i wire electro-discharge machine (Fanuc, Yamanashi, Japan). A brass wire of 0.25 mm diameter was used. Symmetric and rigid clamps were used while cutting. The samples were first cut through the deposit (starting from the top end of the deposit) and finally through the substrate. The cutting speed for all samples was ~0.5 mm/min in the deposit and less in the substrate. The surface displacement profile of the cut surfaces of the samples was measured with a Zeiss Contura g2 coordinate measuring machine (CMM) (Zeiss, Rugby, UK) using a 3 mm diameter touch-trigger probe. The distance from the perimeter and between the individual measurement points of the sample surface was set as 0.2 mm.The displacement data of the cut surfaces of each sample were post-processed using Matlab analysis routines for data aligning, cleaning, flattening and smoothing. The data smoothing of all samples was conducted using a cubic spline with 3 mm knot spacing. A finite element (FE) model of one cut half of the samples was built with 8-node brick elements (C3D8R) of the Abaqus software. A mesh of approx. 0.5 mm size was used on the cut surface. Constraints were applied to the model to avoid rigid body motion. Linear elastic FE analysis with the following material properties was performed to calculate the residual stresses present in the samples before cutting: = 210 GPa, and = 0.30.
- (b)
- X-ray diffraction (XRD): XRD measurements were carried out using a mobile Stresstech X3000 (Stresstech Ltd, Vaajakoski, Finland) with Cr-radiation (30 kV and 8mA) at Sirris. Residual stresses were measured along the centre of a 48 mm wall (48-S2), from the top of the wall to its mid-height. Two sets of measurements were performed on the same locations, one without any surface treatment and one after electropolishing (180–200 µm below the surface). All measurements were performed in the omega-mode using a 3 mm diameter collimator at the Bragg diffraction angle (2θ) of 156.4° for Fe (211) reflection and with a wavelength (λ) of 2.291 Å at an angle of 0° direction (i.e., along the longitudinal or deposition direction of the wall). For each measurement point, there were seven tilt or inclination angles (ψ) varying between 0° and 39.8° using 3 s exposure time. For peak fitting, the Pseudo Voigt method was used for all measurements.
- (c)
- Analytical method: The stress field caused during unclamping could be calculated using the principles of solid mechanics, as proposed by Hönnige et al. [13]. Stress caused by unclamping was calculated using Equation (3), and then residual stresses were calculated using Equation (1) assuming the initial stress field in deposited walls equalled the tensile yield strength of the material, i.e., 502 MPa. Figure 6 schematically represents the cross-section of the substrate and deposited wall, indicating geometric parameters, where subscript “d” stands for deposit and “s” for substrate. The parameter “w” represents the width, either of deposit or substrate, whilst parameter “h” represents the height. The y-axis lies in the direction of the wall height. The location of the neutral axes of deposit and substrate is characterized by their y-coordinate with respect to the bottom of the substrate.
3. Result and Discussion
3.1. Strain Field Captured during DIC-Monitored Unclamping
3.2. Residual Stresses Evaluated Using the DIC-Based Approach
3.3. Validation of DIC Results: Comparison with XRD, Contour Method, and Analytical Prediction
4. Conclusions
- Strain measurements (particularly in the longitudinal direction) obtained from DIC-monitored unclamping demonstrated good repeatability for both wall heights. Repeatability in measurements on the substrate fronts can be questioned due to its small region of interest.
- The proposed DIC-based method allowed capturing of full-field residual stresses for the entire WAAM wall front, showing compressive longitudinal residual stresses at the top centre region of the wall, gradually changing to tensile stresses toward the interface and edges.
- For the 24 mm walls, higher compressive stresses in the longitudinal direction were observed at the top centre of the wall. On the other hand, the magnitude of tensile residual stresses near the interface was higher for the 48 mm walls.
- Residual stress measured using the proposed DIC-based approach demonstrated a good agreement with the results from established stress measurement techniques (contour method, XRD) and analytical predictions, especially for the shorter walls with 24 mm height.
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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Measurement Technique * | Accuracy (MPa) | Depth (mm) | Stress State | |
---|---|---|---|---|
Semi-destructive | Centre-hole drilling | 10–30 | 2 | Allows bi-axial residual stress measurements |
Deep hole drilling | 10–30 | 750 | Bi-axial measurement; tri-axial is possible, but with extra difficulty and reduced accuracy | |
Ring coring | 10–30 | 5 (25 with core removal) | Bi-axial measurements | |
Sachs boring | 10–45 | >100 | Bi-axial measurements | |
Destructive | Slitting | 10–30 | >100 | Uni-axial measurements |
Contour method | Depends on cutting, measuring, smoothing, and filtering methods. | Specimen thickness | Uni-axial measurements | |
Non-destructive | X-ray diffraction | 7–20 | 0.01–0.02 (standard) 1–1.5 (with electro-polishing) | Bi-axial measurements |
Synchrotron diffraction | 10–30 | 20 (steel) 100 (aluminium) | Tri-axial measurements | |
Neutron diffraction | 10–30 | 60 (steel) 100 (aluminium) | Tri-axial measurements | |
Ultrasound | Not reported | 150 | Tri-axial measurements |
Alloying Elements | C | Mn | Si | P | S | V | Cu | Cr | Ni | Mo | Al | Nb | Ti |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ER70S-6 wire | 0.08 | 1.70 | 0.85 | 0.007 | 0.007 | 0.05 | 0.20 | 0.05 | 0.05 | 0.05 | - | - | - |
S355 substrate | 0.12 | 1.50 | 0.50 | 0.025 | 0.020 | 0.20 | - | - | - | - | 0.015 | 0.09 | 0.15 |
Shielding Gas | Welding Mode | Gas Flow (l/min) | Welding Speed (m/min) | Wire Feed Speed AVG (m/min) | Stick-Out (mm) | Current AVG (A) | Voltage AVG (V) | Interlayer Temperature (°C) | |
---|---|---|---|---|---|---|---|---|---|
Layer 1 | Ar + 18% CO2 | CMT | 15 | 0.35 | 7.8 | 17 | 205 | 13.2 | 80–100 |
Layer 2, 3, …17 | Ar + 18% CO2 | CMT | 15 | 0.35 | 6.5 | 17 | 188 | 12.6 | 80–100 |
Specimen Types | Wall Dimension (Length × Height × Width) | Number of Layers | Number of Specimens | Specimen IDs | Measurement Methods |
---|---|---|---|---|---|
Wall—24 | 200 × 24 × 7 | 8 | 2 | 24-S1 | DIC |
24-S2 | DIC, contour method | ||||
Wall—48 | 200 × 48 × 7 | 17 | 2 | 48-S1 | DIC, contour method |
48-S2 | DIC, XRD |
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Boruah, D.; Dewagtere, N.; Ahmad, B.; Nunes, R.; Tacq, J.; Zhang, X.; Guo, H.; Verlinde, W.; De Waele, W. Digital Image Correlation for Measuring Full-Field Residual Stresses in Wire and Arc Additive Manufactured Components. Materials 2023, 16, 1702. https://doi.org/10.3390/ma16041702
Boruah D, Dewagtere N, Ahmad B, Nunes R, Tacq J, Zhang X, Guo H, Verlinde W, De Waele W. Digital Image Correlation for Measuring Full-Field Residual Stresses in Wire and Arc Additive Manufactured Components. Materials. 2023; 16(4):1702. https://doi.org/10.3390/ma16041702
Chicago/Turabian StyleBoruah, Dibakor, Nele Dewagtere, Bilal Ahmad, Rafael Nunes, Jeroen Tacq, Xiang Zhang, Hua Guo, Wim Verlinde, and Wim De Waele. 2023. "Digital Image Correlation for Measuring Full-Field Residual Stresses in Wire and Arc Additive Manufactured Components" Materials 16, no. 4: 1702. https://doi.org/10.3390/ma16041702
APA StyleBoruah, D., Dewagtere, N., Ahmad, B., Nunes, R., Tacq, J., Zhang, X., Guo, H., Verlinde, W., & De Waele, W. (2023). Digital Image Correlation for Measuring Full-Field Residual Stresses in Wire and Arc Additive Manufactured Components. Materials, 16(4), 1702. https://doi.org/10.3390/ma16041702