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Journal: Materials, 2016
Volume: 9
Number: 861
Article:
Reduced Subthreshold Characteristics and Flicker Noise of an AlGaAs/InGaAs PHEMT Using Liquid Phase Deposited TiO2 as a Gate Dielectric
Authors:
by
Kai-Yuen Lam, Jung-Sheng Huang, Yong-Jie Zou, Kuan-Wei Lee and Yeong-Her Wang
Link:
https://www.mdpi.com/1996-1944/9/11/861
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