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Journal: Micromachines, 2020
Volume: 11
Number: 657
657
Article: Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: Modeling Approach
Authors: by Alexander Makarov, Philippe Roussel, Erik Bury, Michiel Vandemaele, Alessio Spessot, Dimitri Linten, Ben Kaczer and Stanislav Tyaginov
Link: https://www.mdpi.com/2072-666X/11/7/657

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