A Scalable Bidimensional Randomization Scheme for TLC 3D NAND Flash Memories

Favalli, Michele; Zambelli, Cristian; Marelli, Alessia; Micheloni, Rino; Olivo, Piero

doi:10.3390/mi12070759

Open AccessArticle

A Scalable Bidimensional Randomization Scheme for TLC 3D NAND Flash Memories

by

Michele Favalli

^1,†

,

Cristian Zambelli

^1,*,†

,

Alessia Marelli

^2,†,

Rino Micheloni

^3,†

and

Piero Olivo

^1,†

¹

Dipartimento di Ingegneria, Università degli Studi di Ferrara, Via G. Saragat 1, 44122 Ferrara, Italy

²

Freelance Consultant, Via Don Pino Puglisi 4, 24048 Treviolo, Italy

³

Freelance Consultant, Via Roma 23, 22010 Moltrasio, Italy

^*

Author to whom correspondence should be addressed.

^†

These authors contributed equally to this work.

Micromachines 2021, 12(7), 759; https://doi.org/10.3390/mi12070759

Submission received: 31 May 2021 / Revised: 24 June 2021 / Accepted: 25 June 2021 / Published: 27 June 2021

(This article belongs to the Special Issue Flash Memory Devices)

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Abstract

Data randomization has been a widely adopted Flash Signal Processing technique for reducing or suppressing errors since the inception of mass storage platforms based on planar NAND Flash technology. However, the paradigm change represented by the 3D memory integration concept has complicated the randomization task due to the increased dimensions of the memory array, especially along the bitlines. In this work, we propose an easy to implement, cost effective, and fully scalable with memory dimensions, randomization scheme that guarantees optimal randomization along the wordline and the bitline dimensions. At the same time, we guarantee an upper bound on the maximum length of consecutive ones and zeros along the bitline to improve the memory reliability. Our method has been validated on commercial off-the-shelf TLC 3D NAND Flash memory with respect to the Raw Bit Error Rate metric extracted in different memory working conditions.

Keywords: 3D NAND Flash; RBER; reliability; flash signal processing; randomization scheme

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MDPI and ACS Style

Favalli, M.; Zambelli, C.; Marelli, A.; Micheloni, R.; Olivo, P. A Scalable Bidimensional Randomization Scheme for TLC 3D NAND Flash Memories. Micromachines 2021, 12, 759. https://doi.org/10.3390/mi12070759

AMA Style

Favalli M, Zambelli C, Marelli A, Micheloni R, Olivo P. A Scalable Bidimensional Randomization Scheme for TLC 3D NAND Flash Memories. Micromachines. 2021; 12(7):759. https://doi.org/10.3390/mi12070759

Chicago/Turabian Style

Favalli, Michele, Cristian Zambelli, Alessia Marelli, Rino Micheloni, and Piero Olivo. 2021. "A Scalable Bidimensional Randomization Scheme for TLC 3D NAND Flash Memories" Micromachines 12, no. 7: 759. https://doi.org/10.3390/mi12070759

APA Style

Favalli, M., Zambelli, C., Marelli, A., Micheloni, R., & Olivo, P. (2021). A Scalable Bidimensional Randomization Scheme for TLC 3D NAND Flash Memories. Micromachines, 12(7), 759. https://doi.org/10.3390/mi12070759

Note that from the first issue of 2016, this journal uses article numbers instead of page numbers. See further details here.

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A Scalable Bidimensional Randomization Scheme for TLC 3D NAND Flash Memories

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