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Journal: MicromachinesVolume: 13Number: 2002
Article: Fast Fitting of the Dynamic Memdiode Model to the Conduction Characteristics of RRAM Devices Using Convolutional Neural Networks
  • Authors:
  • Fernando Leonel Aguirre1,*,
  • Eszter Piros2 and
  • Enrique Miranda1,*
  • et al.
Link: https://www.mdpi.com/2072-666X/13/11/2002

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