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Journal: Micromachines, 2022
Volume: 13
Number: 1042

Article: Effect of the Oxidation Process on Carrier Lifetime and on SF Defects of 4H SiC Thick Epilayer for Detection Applications
Authors: by Alessandro Meli, Annamaria Muoio, Riccardo Reitano, Enrico Sangregorio, Lucia Calcagno, Antonio Trotta, Miriam Parisi, Laura Meda and Francesco La Via
Link: https://www.mdpi.com/2072-666X/13/7/1042

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