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Journal: Micromachines, 2023
Volume: 14
Number: 2023

Article: An Aging Small-Signal Model for Degradation Prediction of Microwave Heterojunction Bipolar Transistor S-Parameters Based on Prior Knowledge Neural Network
Authors: by Lin Cheng, Hongliang Lu, Silu Yan, Chen Liu, Jiantao Qiao, Junjun Qi, Wei Cheng, Yimen Zhang and Yuming Zhang
Link: https://www.mdpi.com/2072-666X/14/11/2023

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