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Journal: Micromachines, 2025
Volume: 16
Number: 1193
1193
Article: Electrical Characterization and Simulation of GaN-on-Si Pseudo-Vertical MOSFETs with Frequency-Dependent Gate C–V Investigation
Authors: by Valentin Ackermann, Mohammed El Amrani, Blend Mohamad, Riadh Ben Abbes, Matthew Charles, Sebastien Cavalaglio, Manuel Manrique, Julien Buckley and Bassem Salem
Link: https://www.mdpi.com/2072-666X/16/11/1193

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