Lee, H.-T.; Ji, G.-S.; Oh, J.-Y.; Seo, C.-W.; Kang, B.-W.; Kim, K.-W.; Park, H.-R.
Measuring Complex Refractive Indices of a Nanometer-Thick Superconducting Film Using Terahertz Time-Domain Spectroscopy with a 10 Femtoseconds Pulse Laser. Crystals 2021, 11, 651.
https://doi.org/10.3390/cryst11060651
AMA Style
Lee H-T, Ji G-S, Oh J-Y, Seo C-W, Kang B-W, Kim K-W, Park H-R.
Measuring Complex Refractive Indices of a Nanometer-Thick Superconducting Film Using Terahertz Time-Domain Spectroscopy with a 10 Femtoseconds Pulse Laser. Crystals. 2021; 11(6):651.
https://doi.org/10.3390/cryst11060651
Chicago/Turabian Style
Lee, Hyoung-Taek, Gang-Seon Ji, Jun-Yung Oh, Choong-Won Seo, Byeong-Won Kang, Kyung-Wan Kim, and Hyeong-Ryeol Park.
2021. "Measuring Complex Refractive Indices of a Nanometer-Thick Superconducting Film Using Terahertz Time-Domain Spectroscopy with a 10 Femtoseconds Pulse Laser" Crystals 11, no. 6: 651.
https://doi.org/10.3390/cryst11060651
APA Style
Lee, H. -T., Ji, G. -S., Oh, J. -Y., Seo, C. -W., Kang, B. -W., Kim, K. -W., & Park, H. -R.
(2021). Measuring Complex Refractive Indices of a Nanometer-Thick Superconducting Film Using Terahertz Time-Domain Spectroscopy with a 10 Femtoseconds Pulse Laser. Crystals, 11(6), 651.
https://doi.org/10.3390/cryst11060651