Automated Optical Inspection Method for Light-Emitting Diode Defect Detection Using Unsupervised Generative Adversarial Neural Network
Abstract
:1. Introduction
2. Experiment and Architecture of the System
2.1. Introduction of the AOI System
2.2. Dataset
2.3. The Contextual Loss Function and the Score Function
2.4. Parameter Optimizations
- The weights of three loss functions are tested separately at intervals of 10, and the tests range from 1 to 100. Each of the functions has 11 parameters, thus there are a total of 113 possibilities under the interactive test. Since it is inefficient to calculate these one by one, we use a 3-stage random sampling approximation method to obtain the best solution.
- The sizes of latent representations are 64, 100, 128, 256, 512, and 1024. The tests are used to ensure the model will not be confronted with the bottleneck effect, which is caused by the excessive amount of image pixels.
- The image resolutions are 64 × 64, 128 × 128, and 256 × 256 pixels. To ensure the image features are retained, it is vital to select the most suitable model for subsequent image scoring processing under different image sizes and sufficient model convergence (good generation ability).
- For architecture 2 and architecture 3, the parameters of the SSIM size are optimized. The intervals are set to 1 and ranges from 8 to 14.
- Optimizing the scoring weight λ. To find the best ratio for the score function, based on the difference between the model contextual and the encoder, we set the interval to 0.1 and the range from 0 to 1.
- For architecture 2 and architecture 3, the SSIM score in the score function is optimized with the kernel size, and the interval is set to 1 and range from 8 to 14.
2.5. Hardware and Software Configurations
3. Results and Discussion
3.1. Performance of GANomaly-L1-L1
- The ability of the model to generate original data is limited. In other words, the generated image cannot sufficiently retain the normal data features of the original real image, and the fake image restoration is excessively consistent, so the features images are not good enough to identify abnormalities in the subsequent scoring step.
- Under the assumption that the first problem does not exist, the abilities of the previous scoring functions are too compendious to distinguish images, which is the main problem of the L1 score function.
3.2. Performance of GANomaly-SSIM-L1
3.3. Performance of GANomaly-SSIM-SSIM
3.4. Comparisons of Algorithms
3.5. Performance of Pre-Labeled Method
4. Conclusions
Author Contributions
Funding
Acknowledgments
Conflicts of Interest
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Parameter | GANomaly-L1-L1 | GANomaly-SSIM-L1 | GANomaly-SSIM-SSIM |
---|---|---|---|
Contextual loss | 1 | 50 | 50 |
Encoder loss | 1 | 1 | 1 |
Adversarial loss | 20 | 1 | 1 |
Latent size | 100 | 100 | 100 |
Image size | 64 | 128 | 128 |
Kernel size | x | 11 | 11 |
Score weight (λ) | 0.5 | 0.8 | 0.8 |
Parameter | Value |
---|---|
Training epochs | 200 |
Learning rate | 0.0001 |
Earning policy | lambda |
Batch size | 1 |
Momentum beta | 0.5 |
Algorithm | Size (Pixels) | AUC | AUC Improvement (%) | Inference (s) |
---|---|---|---|---|
GANomaly-L1-L1 | 64 | 0.8395 | 0 | 0.0027 |
GANomaly-SSIM-L1 | 128 | 0.8801 | 4.8 | 0.0075 |
GANomaly-SSIM-SSIM | 128 | 0.9524 | 13.4 | 0.0076 |
Labeling | Number of Labels per Minute | Enhancement |
---|---|---|
Labor | 3 | -- |
GANomaly-SSIM-SSIM | 63 | 21× |
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Huang, C.-H.; Lee, P.-H.; Chang, S.-H.; Kuo, H.-C.; Sun, C.-W.; Lin, C.-C.; Tsai, C.-L.; Liu, X. Automated Optical Inspection Method for Light-Emitting Diode Defect Detection Using Unsupervised Generative Adversarial Neural Network. Crystals 2021, 11, 1048. https://doi.org/10.3390/cryst11091048
Huang C-H, Lee P-H, Chang S-H, Kuo H-C, Sun C-W, Lin C-C, Tsai C-L, Liu X. Automated Optical Inspection Method for Light-Emitting Diode Defect Detection Using Unsupervised Generative Adversarial Neural Network. Crystals. 2021; 11(9):1048. https://doi.org/10.3390/cryst11091048
Chicago/Turabian StyleHuang, Che-Hsuan, Pei-Hsuan Lee, Shu-Hsiu Chang, Hao-Chung Kuo, Chia-Wei Sun, Chien-Chung Lin, Chun-Lin Tsai, and Xinke Liu. 2021. "Automated Optical Inspection Method for Light-Emitting Diode Defect Detection Using Unsupervised Generative Adversarial Neural Network" Crystals 11, no. 9: 1048. https://doi.org/10.3390/cryst11091048
APA StyleHuang, C.-H., Lee, P.-H., Chang, S.-H., Kuo, H.-C., Sun, C.-W., Lin, C.-C., Tsai, C.-L., & Liu, X. (2021). Automated Optical Inspection Method for Light-Emitting Diode Defect Detection Using Unsupervised Generative Adversarial Neural Network. Crystals, 11(9), 1048. https://doi.org/10.3390/cryst11091048