Yan, H.; Tan, J.; Luo, Y.; Wang, S.; Wan, J.
Multi-Condition Intelligent Fault Diagnosis Based on Tree-Structured Labels and Hierarchical Multi-Granularity Diagnostic Network. Machines 2024, 12, 891.
https://doi.org/10.3390/machines12120891
AMA Style
Yan H, Tan J, Luo Y, Wang S, Wan J.
Multi-Condition Intelligent Fault Diagnosis Based on Tree-Structured Labels and Hierarchical Multi-Granularity Diagnostic Network. Machines. 2024; 12(12):891.
https://doi.org/10.3390/machines12120891
Chicago/Turabian Style
Yan, Hehua, Jinbiao Tan, Yixiong Luo, Shiyong Wang, and Jiafu Wan.
2024. "Multi-Condition Intelligent Fault Diagnosis Based on Tree-Structured Labels and Hierarchical Multi-Granularity Diagnostic Network" Machines 12, no. 12: 891.
https://doi.org/10.3390/machines12120891
APA Style
Yan, H., Tan, J., Luo, Y., Wang, S., & Wan, J.
(2024). Multi-Condition Intelligent Fault Diagnosis Based on Tree-Structured Labels and Hierarchical Multi-Granularity Diagnostic Network. Machines, 12(12), 891.
https://doi.org/10.3390/machines12120891