Dielectric Hybrid Optimization Model Based on Crack Damage in Semi-Rigid Base Course
Abstract
:1. Introduction
2. Dielectric Mixing Modeling of Semi-Rigid Base Course Materials
2.1. Generalized Dielectric Mixing Model for Multiphase Hybrid Composites
2.2. Dielectric Mixing Modeling of Semi-Rigid Base Materials
2.2.1. Semi-Rigid Base Course Material Intact
2.2.2. Semi-Rigid Base Course Material Cracking
2.3. Prediction of the Relative Permittivity Constant of the Semi-Rigid Base Course Material
3. Semi-Rigid Base Course Material Dielectric Mixing Model Design and Data Acquisition
3.1. Semi-Rigid Base Course Material Properties and Its Testing Equipment
3.1.1. Basic Properties of Semi-Rigid Base Course Materials and Their Raw Materials
3.1.2. Test Equipment for Base Materials
- (1)
- Dielectric Characterization Test Equipment
- (2)
- Computed Tomography Scanning Equipment
3.2. Test Program and Measured Data
- (1)
- The purpose of CT image preprocessing of cement-stabilized gravel specimens is to reduce image noise, enhance contrast, and improve image quality for subsequent segmentation and analysis. It consists of the following steps. Gray scale transformation: convert the CT image to a gray-scale image to reduce the computational complexity and simplify the subsequent processing steps. Denoising: use filters (e.g., Gaussian filter, median filter) to remove noise from the image and improve the smoothness of the image to reduce the interference of subsequent segmentation algorithms. Contrast enhancement: enhance the contrast of the image through histogram equalization and other techniques, so that the gray-scale value distribution of different components is more uniform, so that the boundaries of different components are clearer, which is conducive to the subsequent threshold segmentation.
- (2)
- CT image segmentation of cement-stabilized crushed stone specimens aims to divide the image into three parts, namely, coarse aggregate, cement mortar, and pore air, and the commonly used methods include threshold segmentation and region growing. Threshold segmentation is based on image gray-scale values, and the Otsu method automatically determines the optimal threshold by maximizing the interclass variance, which is suitable for images with obvious contrast between foreground and background. Conversely, region growing is based on pixel similarity, extends from seed points, and is suitable for images with complex backgrounds. The two methods can be used in combination to improve segmentation accuracy and provide a basis for subsequent analysis.
- (3)
- Classification and labeling of segmented image regions to identify the different components of coarse aggregate mineral, cement paste, and pore air. Region labeling is applied to label the segmented regions to ensure that each region is uniquely identified, marking out the different connected regions. Based on the characteristics of the segmented regions (e.g., gray-scale value, shape, etc.), the regions are categorized into coarse aggregate mineral, cementitious slurry, and pore air.
- (4)
- The volume proportions of each component in the material are calculated by first traversing each CT image of the specimen to count the number of pixels corresponding to each region, namely, the cementitious paste, coarse aggregate, and pore air. Based on the total pixel count, the volume proportion of each component is then determined, representing the fraction of the total volume occupied by each material. This method allows for a detailed analysis of the compositional structure and proportions of the material.
4. Optimization and Comparison of Dielectric Mixing Model Parameters for Base Materials
4.1. Optimization of Dielectric Mixing Model Parameters
4.2. Comparative Analysis of Dielectric Mixing Models for Base Materials
5. Conclusions
- (1)
- To account for the complexity of the morphology of the mixed material components, the shape factor u of the component phases is introduced into the Böttcher dielectric mixing model of traditional multiphase composites. Based on the volume and dielectric properties of the base material specimens in both intact and cracked states, the optimal value of u in the dielectric mixing model for cement-stabilized gravel base material is determined to be 1. Consequently, the dielectric mixing optimization model for cement-stabilized gravel base material is constructed to be applicable to the cracked state of semi-rigid base course material.
- (2)
- Compared to the Böttcher and Rayleigh dielectric mixing models, the optimization model for cement-stabilized aggregate base material exhibits the smallest goodness-of-fit, average absolute error, and average relative error, with values of 0.8890, 0.235, and 3.47%, respectively. This indicates that the optimization model is more suitable for predicting the dielectric properties of cement-stabilized aggregate base material.
- (3)
- The optimization model for the dielectric mixing of cement-stabilized aggregates significantly enhances the accuracy of predicting the dielectric properties of base materials with high porosity, achieving an average absolute error and average relative error of only 0.072 and 1.22%, respectively. Additionally, the prediction accuracy of the optimization model is influenced by the crack damage state of the base material; as the crack width increases, the average relative error of the optimization model in predicting the dielectric properties of the base material also increases.
Author Contributions
Funding
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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Normative | Stone Crush Value | Content of Needle and Flake Particles | Dust Content Below 0.075 mm (in %) | Soft Rock Content | Plasticity Index | Organic Matter Content (%) | Sulfate Content (%) |
---|---|---|---|---|---|---|---|
Results | 13.2 | 14 | 0.8 | 2.4 | 13 | 1.1 | 0.08 |
MgO (%) | SO3 (%) | Burning Vector (%) | Cl− (%) | Surface Area (m2) | Fineness (%) | Setting Time (min) | Flexural Strength (MPa) | Compressive Strength (MPa) | |||
---|---|---|---|---|---|---|---|---|---|---|---|
Initial Setting | Final Setting | 3d | 28d | 3d | 28d | ||||||
≤5.0 | ≤3.5 | ≤3.5 | ≤0.06 | 300 | ≤8.0 | ≥45 | ≤600 | ≥6.5 | ≥5.5 | ≥56.0 | ≥2.5 |
Sieve size (mm) | 31.5 | 26.5 | 19 | 9.5 | 4.75 | 2.36 | 0.6 | 0.075 |
Upper limit of gradation | 100 | 100 | 86 | 60 | 35 | 18 | 15 | 5 |
lower limit of gradation | 100 | 90 | 68 | 38 | 22 | 26 | 8 | 0 |
Synthetic gradation | 100 | 100 | 80.4 | 48.4 | 30.3 | 20.8 | 11.6 | 4.4 |
Number | (%) | (%) | (%) | w (mm) | r (mm) | ||||
---|---|---|---|---|---|---|---|---|---|
1-1 | 5.21 | 33.81 | 8.63 | 64.08 | 1 | 2.11 | 0 | 75 | 7.26 |
1-2 | 5.21 | 33.52 | 8.63 | 63.54 | 1 | 2.93 | 1 | 75 | 7.21 |
1-3 | 5.21 | 33.24 | 8.63 | 63.01 | 1 | 3.74 | 2 | 75 | 7.15 |
1-4 | 5.21 | 32.97 | 8.63 | 62.49 | 1 | 4.54 | 3 | 75 | 7.09 |
1-5 | 5.21 | 32.70 | 8.63 | 61.98 | 1 | 5.32 | 4 | 75 | 7.06 |
1-6 | 5.21 | 32.43 | 8.63 | 61.47 | 1 | 6.10 | 5 | 75 | 6.99 |
1-7 | 5.21 | 31.91 | 8.63 | 60.49 | 1 | 7.60 | 7 | 75 | 6.91 |
Number | (%) | (%) | (%) | w (mm) | r (mm) | ||||
---|---|---|---|---|---|---|---|---|---|
2-1 | 5.21 | 33.29 | 8.63 | 63.08 | 1 | 3.63 | 0 | 75 | 7.15 |
2-2 | 5.21 | 33.01 | 8.63 | 62.55 | 1 | 4.44 | 1 | 75 | 7.11 |
2-3 | 5.21 | 32.73 | 8.63 | 62.03 | 1 | 5.24 | 2 | 75 | 7.06 |
2-4 | 5.21 | 32.46 | 8.63 | 61.52 | 1 | 6.02 | 3 | 75 | 6.97 |
2-5 | 5.21 | 32.19 | 8.63 | 61.01 | 1 | 6.79 | 4 | 75 | 6.93 |
2-6 | 5.21 | 31.93 | 8.63 | 60.52 | 1 | 7.55 | 5 | 75 | 6.88 |
2-7 | 5.21 | 31.42 | 8.63 | 59.55 | 1 | 9.03 | 7 | 75 | 6.79 |
Number | (%) | (%) | (%) | w (mm) | r (mm) | ||||
---|---|---|---|---|---|---|---|---|---|
3-1 | 5.21 | 32.69 | 8.63 | 61.89 | 1 | 5.42 | 0 | 75 | 6.97 |
3-2 | 5.21 | 32.41 | 8.63 | 61.37 | 1 | 6.22 | 1 | 75 | 6.92 |
3-3 | 5.21 | 32.14 | 8.63 | 60.86 | 1 | 7.00 | 2 | 75 | 6.87 |
3-4 | 5.21 | 31.88 | 8.63 | 60.35 | 1 | 7.77 | 3 | 75 | 6.85 |
3-5 | 5.21 | 31.62 | 8.63 | 59.86 | 1 | 8.53 | 4 | 75 | 6.81 |
3-6 | 5.21 | 31.36 | 8.63 | 59.37 | 1 | 9.27 | 5 | 75 | 6.76 |
3-7 | 5.21 | 30.86 | 8.63 | 58.42 | 1 | 10.72 | 7 | 75 | 6.65 |
Number | (%) | (%) | (%) | w (mm) | r (mm) | ||||
---|---|---|---|---|---|---|---|---|---|
4-1 | 5.21 | 32.17 | 8.63 | 60.79 | 1 | 7.04 | 0 | 75 | 6.89 |
4-2 | 5.21 | 31.90 | 8.63 | 60.28 | 1 | 7.82 | 1 | 75 | 6.85 |
4-3 | 5.21 | 31.63 | 8.63 | 59.78 | 1 | 8.59 | 2 | 75 | 6.79 |
4-4 | 5.21 | 31.37 | 8.63 | 59.28 | 1 | 9.35 | 3 | 75 | 6.76 |
4-5 | 5.21 | 31.11 | 8.63 | 58.79 | 1 | 10.09 | 4 | 75 | 6.10 |
4-6 | 5.21 | 30.86 | 8.63 | 58.32 | 1 | 10.82 | 5 | 75 | 6.00 |
4-7 | 5.21 | 30.36 | 8.63 | 57.38 | 1 | 12.25 | 7 | 75 | 5.83 |
Number | (%) | (%) | (%) | w (mm) | r (mm) | ||||
---|---|---|---|---|---|---|---|---|---|
5-1 | 5.21 | 31.63 | 8.63 | 59.61 | 1 | 8.76 | 0 | 75 | 6.32 |
5-2 | 5.21 | 31.37 | 8.63 | 59.10 | 1 | 9.53 | 1 | 75 | 6.25 |
5-3 | 5.21 | 31.11 | 8.63 | 58.61 | 1 | 10.28 | 2 | 75 | 6.19 |
5-4 | 5.21 | 30.85 | 8.63 | 58.13 | 1 | 11.03 | 3 | 75 | 6.07 |
5-5 | 5.21 | 30.59 | 8.63 | 57.65 | 1 | 11.76 | 4 | 75 | 6.01 |
5-6 | 5.21 | 30.35 | 8.63 | 57.18 | 1 | 12.47 | 5 | 75 | 5.83 |
5-7 | 5.21 | 29.86 | 8.63 | 56.26 | 1 | 13.88 | 7 | 75 | 5.68 |
Number | (%) | (%) | (%) | w (mm) | r (mm) | ||||
---|---|---|---|---|---|---|---|---|---|
6-1 | 5.21 | 31.29 | 8.63 | 58.83 | 1 | 9.88 | 0 | 75 | 6.21 |
6-2 | 5.21 | 31.03 | 8.63 | 58.33 | 1 | 10.64 | 1 | 75 | 6.16 |
6-3 | 5.21 | 30.77 | 8.63 | 57.84 | 1 | 11.38 | 2 | 75 | 6.09 |
6-4 | 5.21 | 30.52 | 8.63 | 57.36 | 1 | 12.12 | 3 | 75 | 5.98 |
6-5 | 5.21 | 30.27 | 8.63 | 56.89 | 1 | 12.84 | 4 | 75 | 5.84 |
6-6 | 5.21 | 30.02 | 8.63 | 56.43 | 1 | 13.55 | 5 | 75 | 5.75 |
6-7 | 5.21 | 29.54 | 8.63 | 55.53 | 1 | 14.93 | 7 | 75 | 5.56 |
Parameters | W | Conclude | |
---|---|---|---|
result | 0.964 | 0.942 | No rejection of the original hypothesis |
Crack Width of Specimen (mm) | Optimization Models (%) | Böttcher Model (%) | Rayleigh Models (%) |
---|---|---|---|
0 | 2.67 | 2.64 | 2.82 |
1 | 2.93 | 2.87 | 3.07 |
2 | 3.20 | 3.03 | 3.26 |
3 | 3.66 | 3.52 | 3.77 |
4 | 3.32 | 4.21 | 4.13 |
5 | 3.91 | 4.86 | 4.80 |
7 | 4.60 | 5.67 | 5.63 |
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Huang, Z.; Xu, G.; Yu, H.; Xiong, X.; Zang, B. Dielectric Hybrid Optimization Model Based on Crack Damage in Semi-Rigid Base Course. Buildings 2024, 14, 3599. https://doi.org/10.3390/buildings14113599
Huang Z, Xu G, Yu H, Xiong X, Zang B. Dielectric Hybrid Optimization Model Based on Crack Damage in Semi-Rigid Base Course. Buildings. 2024; 14(11):3599. https://doi.org/10.3390/buildings14113599
Chicago/Turabian StyleHuang, Zhiyong, Guoyuan Xu, Huayang Yu, Xuetang Xiong, and Bo Zang. 2024. "Dielectric Hybrid Optimization Model Based on Crack Damage in Semi-Rigid Base Course" Buildings 14, no. 11: 3599. https://doi.org/10.3390/buildings14113599
APA StyleHuang, Z., Xu, G., Yu, H., Xiong, X., & Zang, B. (2024). Dielectric Hybrid Optimization Model Based on Crack Damage in Semi-Rigid Base Course. Buildings, 14(11), 3599. https://doi.org/10.3390/buildings14113599