Effect of the Crystal Structure on the Piezoelectricity of [001]-Textured (Na, K)(Nb, Sb)O3-SrZrO3-(Bi, Ag)ZrO3 Lead-Free Piezoelectric Thick Film
Round 1
Reviewer 1 Report
Some words need to be defined for the new readers ( Lotgering factors, etc.).
Word texture has been used in many places is it the right word to use?
Figured 3d and e, please explain the behaviour of dielectric loss
Comparing the final results with the state-of-the-art results is recommended
Some of the experimental details are missing, like how you texture, etc
Author Response
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Author Response File: 
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Reviewer 2 Report
Comments to the authors
As well know, the value of the transverse magnetoelectric voltage coefficient (MEVC) is proportional to the product piezomagnetic coefficient mq11 to the ratio piezoelectric coefficient to dielectric the permittivity pd31/pε33. The authors increased the ratio pd31/pε33using the fabricated on the base piezoceramic PbZr0.53Ti0.47O3/Epoxy particulate piezoelectric composite and research their magnetoelectric characteristics these composites.
The work is enough novel, contains new scientific results; graphical figures look very well. But before publication authors need to do next corrections:
Q1) P5. Authors wrote “ME properties can be discussed in terms of the theories based on the
method of effective material parameters [15, 16]”
It is not right. Method effective parameters, developed in work doi.org/10.1103/PhysRevB.68.054402 is supposed that bilayer structure is considered as a homogeneous medium with some effective parameters such as the effective piezoelectric modulus and the effective piezomagnetic coefficient.
Theory, presented in work [16] is based on the joint solution of the system of equations for the piezoelectric and magnetostrictive phases, taking into account the conditions at the interface.
It follows that <ρ. and <s11> are not effective parameters, and the average values of the corresponding parameters.
Q2) As well know, that resonance frequency depends of the bias magnetic field doi.org/10.1103/PhysRevB.71.184423, but on Fig.2 the resonance frequency are the same for different values bias magnetic field. Authors need explain this fact.
Q3) Resonance frequency of the bending oscillation depends on how the sample was fixed. Authors calculated the bending resonance frequency using Eq. 2, but they didn’t show, how the sample was fixed.
Q4) The structure has two lengths: MZFL and PZT/EL. At the calculation of the resonance frequency authors using the length PZT/EL. It needs to explain.
Q5) The dependence mλ11 has maximum at H==0, сconsequently at H==0,
i.e., at H==0. But on Fig.2 MEVC α31 is not equals zero at H==0. Authors need explain this fact.
Comments for author File: 
Comments.docx
Author Response
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Reviewer 3 Report
The article can be accepted in the present form.
Author Response
The article can be accepted in the present form.
Reviewer 4 Report
This paper presented the experimental finding on the increase of the piezoelectric effects of textured NKNS thick films. The improvement is remarkable and it is potentially useful.
The changes in film properties are obtained through the alignment with NN seeds. Textures are created in thick films. The texture change will change the properties of the film, as it is known. Now the question is what is the cause of the change? Is it due to the alignment or the texture itself? This is a question the authors should explain, and give a better explanation about the effect of the texture without alignment.
Also the paper is too long. Please make it short for more interest to read it.
Author Response
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