Dai, D.; Wang, Z.; Huang, H.; Mao, X.; Liu, Y.; Li, H.; Chen, D.
The RF–Absolute Gradient Method for Localizing Wheat Moisture Content’s Abnormal Regions with 2D Microwave Scanning Detection. Agriculture 2025, 15, 1649.
https://doi.org/10.3390/agriculture15151649
AMA Style
Dai D, Wang Z, Huang H, Mao X, Liu Y, Li H, Chen D.
The RF–Absolute Gradient Method for Localizing Wheat Moisture Content’s Abnormal Regions with 2D Microwave Scanning Detection. Agriculture. 2025; 15(15):1649.
https://doi.org/10.3390/agriculture15151649
Chicago/Turabian Style
Dai, Dong, Zhenyu Wang, Hao Huang, Xu Mao, Yehong Liu, Hao Li, and Du Chen.
2025. "The RF–Absolute Gradient Method for Localizing Wheat Moisture Content’s Abnormal Regions with 2D Microwave Scanning Detection" Agriculture 15, no. 15: 1649.
https://doi.org/10.3390/agriculture15151649
APA Style
Dai, D., Wang, Z., Huang, H., Mao, X., Liu, Y., Li, H., & Chen, D.
(2025). The RF–Absolute Gradient Method for Localizing Wheat Moisture Content’s Abnormal Regions with 2D Microwave Scanning Detection. Agriculture, 15(15), 1649.
https://doi.org/10.3390/agriculture15151649
