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Article

Measurement of Quantum Yields of Monolayer TMDs Using Dye-Dispersed PMMA Thin Films

by
Shrawan Roy
1,
Anir S. Sharbirin
1,
Yongjun Lee
1,
Won Bin Kim
2,
Tae Soo Kim
3,
Kiwon Cho
3,
Kibum Kang
3,
Hyun Suk Jung
2 and
Jeongyong Kim
1,*
1
Department of Energy Science, Sungkyunkwan University, Suwon 16419, Korea
2
School of Advanced Materials Science & Engineering, Sungkyunkwan University, Suwon 16419, Korea
3
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Korea
*
Author to whom correspondence should be addressed.
Nanomaterials 2020, 10(6), 1032; https://doi.org/10.3390/nano10061032
Submission received: 17 April 2020 / Revised: 19 May 2020 / Accepted: 25 May 2020 / Published: 28 May 2020
(This article belongs to the Special Issue Characterization, Synthesis and Applications of 2D Nanomaterials)
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Abstract

In general, the quantum yields (QYs) of monolayer transition metal dichalcogenides (1L-TMDs) are low, typically less than 1% in their pristine state, significantly limiting their photonic applications. Many methods have been reported to increase the QYs of 1L-TMDs; however, the technical difficulties involved in the reliable estimation of these QYs have prevented the general assessment of these methods. Herein, we demonstrate the estimation of the QYs of 1L-TMDs using a poly methyl methacrylate (PMMA) thin film embedded with rhodamine 6G (R6G) as a reference specimen for measuring the QYs of 1L-TMDs. The PMMA/R6G composite films with thicknesses of 80 and 300 nm demonstrated spatially homogeneous emissions with the incorporation of well-dispersed R6G molecules, and may, therefore, be used as ideal reference specimens for the QY measurement of 1L-TMDs. Using our reference specimens, for which the QY ranged from 5.4% to 22.2% depending on the film thickness and R6G concentrations, we measured the QYs of the exfoliated or chemical vapor deposition (CVD)-grown 1L-WS2, -MoSe2, -MoS2, and -WSe2 TMDs. The convenient procedure proposed in this study for preparing the thin reference films and the simple protocol for the QY estimation of 1L-TMDs may enable accurate comparisons of the absolute QYs between the 1L-TMD samples, thereby enabling the development of a method to improve the QY of 1L-TMDs.
Keywords: quantum yield; molybdenum disulfide; molybdenum diselenide; tungsten disulfide; tungsten diselenide; 2D semiconductors; photoluminescence quantum yield; molybdenum disulfide; molybdenum diselenide; tungsten disulfide; tungsten diselenide; 2D semiconductors; photoluminescence

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MDPI and ACS Style

Roy, S.; Sharbirin, A.S.; Lee, Y.; Kim, W.B.; Kim, T.S.; Cho, K.; Kang, K.; Jung, H.S.; Kim, J. Measurement of Quantum Yields of Monolayer TMDs Using Dye-Dispersed PMMA Thin Films. Nanomaterials 2020, 10, 1032. https://doi.org/10.3390/nano10061032

AMA Style

Roy S, Sharbirin AS, Lee Y, Kim WB, Kim TS, Cho K, Kang K, Jung HS, Kim J. Measurement of Quantum Yields of Monolayer TMDs Using Dye-Dispersed PMMA Thin Films. Nanomaterials. 2020; 10(6):1032. https://doi.org/10.3390/nano10061032

Chicago/Turabian Style

Roy, Shrawan, Anir S. Sharbirin, Yongjun Lee, Won Bin Kim, Tae Soo Kim, Kiwon Cho, Kibum Kang, Hyun Suk Jung, and Jeongyong Kim. 2020. "Measurement of Quantum Yields of Monolayer TMDs Using Dye-Dispersed PMMA Thin Films" Nanomaterials 10, no. 6: 1032. https://doi.org/10.3390/nano10061032

APA Style

Roy, S., Sharbirin, A. S., Lee, Y., Kim, W. B., Kim, T. S., Cho, K., Kang, K., Jung, H. S., & Kim, J. (2020). Measurement of Quantum Yields of Monolayer TMDs Using Dye-Dispersed PMMA Thin Films. Nanomaterials, 10(6), 1032. https://doi.org/10.3390/nano10061032

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