Impact of Residual Strains on the Carrier Mobility and Sability of Perovskite Films
Abstract
:1. Introduction
1.1. Stress Origin in Perovskite Films
1.2. Impact on Electrical, Optical Properties and Stability
1.3. Regulation of Strain in Perovskite Films
2. Experimental Section
3. Results and Discussion
3.1. Williamson Hall Characterization
3.2. Gixrd Characterization
3.3. SEM Characterization
3.4. Hall Effect Characterization
3.5. Raman Characterization
4. Conclusions
Author Contributions
Funding
Data Availability Statement
Conflicts of Interest
Abbreviations
GIXRD | grazing incident X-ray diffraction |
CTE | coefficient of thermal expansion |
PSC | perovskite solar cell |
XRD | X-ray diffraction |
FWHM | full-width half-maximum |
References
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Slimani, M.A.; Gerlein, L.F.; Izquierdo, R.; Cloutier, S.G. Impact of Residual Strains on the Carrier Mobility and Sability of Perovskite Films. Nanomaterials 2024, 14, 1310. https://doi.org/10.3390/nano14151310
Slimani MA, Gerlein LF, Izquierdo R, Cloutier SG. Impact of Residual Strains on the Carrier Mobility and Sability of Perovskite Films. Nanomaterials. 2024; 14(15):1310. https://doi.org/10.3390/nano14151310
Chicago/Turabian StyleSlimani, Moulay Ahmed, Luis Felipe Gerlein, Ricardo Izquierdo, and Sylvain G. Cloutier. 2024. "Impact of Residual Strains on the Carrier Mobility and Sability of Perovskite Films" Nanomaterials 14, no. 15: 1310. https://doi.org/10.3390/nano14151310