Lechowski, B.; Kutukova, K.; Grenzer, J.; Panchenko, I.; Krueger, P.; Clausner, A.; Zschech, E.
Laboratory X-ray Microscopy of 3D Nanostructures in the Hard X-ray Regime Enabled by a Combination of Multilayer X-ray Optics. Nanomaterials 2024, 14, 233.
https://doi.org/10.3390/nano14020233
AMA Style
Lechowski B, Kutukova K, Grenzer J, Panchenko I, Krueger P, Clausner A, Zschech E.
Laboratory X-ray Microscopy of 3D Nanostructures in the Hard X-ray Regime Enabled by a Combination of Multilayer X-ray Optics. Nanomaterials. 2024; 14(2):233.
https://doi.org/10.3390/nano14020233
Chicago/Turabian Style
Lechowski, Bartlomiej, Kristina Kutukova, Joerg Grenzer, Iuliana Panchenko, Peter Krueger, Andre Clausner, and Ehrenfried Zschech.
2024. "Laboratory X-ray Microscopy of 3D Nanostructures in the Hard X-ray Regime Enabled by a Combination of Multilayer X-ray Optics" Nanomaterials 14, no. 2: 233.
https://doi.org/10.3390/nano14020233
APA Style
Lechowski, B., Kutukova, K., Grenzer, J., Panchenko, I., Krueger, P., Clausner, A., & Zschech, E.
(2024). Laboratory X-ray Microscopy of 3D Nanostructures in the Hard X-ray Regime Enabled by a Combination of Multilayer X-ray Optics. Nanomaterials, 14(2), 233.
https://doi.org/10.3390/nano14020233