Wang, J.; Wang, Z.; Chen, D.; Pei, Z.; Shen, J.; Zhou, N.
Degradation Mechanisms in Metallized Barrier Films for Vacuum Insulation Panels Subjected to Flanging-Induced Stress. Nanomaterials 2025, 15, 1231.
https://doi.org/10.3390/nano15161231
AMA Style
Wang J, Wang Z, Chen D, Pei Z, Shen J, Zhou N.
Degradation Mechanisms in Metallized Barrier Films for Vacuum Insulation Panels Subjected to Flanging-Induced Stress. Nanomaterials. 2025; 15(16):1231.
https://doi.org/10.3390/nano15161231
Chicago/Turabian Style
Wang, Juan, Ziling Wang, Delei Chen, Zhibin Pei, Jian Shen, and Ningning Zhou.
2025. "Degradation Mechanisms in Metallized Barrier Films for Vacuum Insulation Panels Subjected to Flanging-Induced Stress" Nanomaterials 15, no. 16: 1231.
https://doi.org/10.3390/nano15161231
APA Style
Wang, J., Wang, Z., Chen, D., Pei, Z., Shen, J., & Zhou, N.
(2025). Degradation Mechanisms in Metallized Barrier Films for Vacuum Insulation Panels Subjected to Flanging-Induced Stress. Nanomaterials, 15(16), 1231.
https://doi.org/10.3390/nano15161231