Svrcek, V.; Kolenda, M.; Kadys, A.; Reklaitis, I.; Dobrovolskas, D.; Malinauskas, T.; Lozach, M.; Mariotti, D.; Strassburg, M.; Tomašiūnas, R.
Significant Carrier Extraction Enhancement at the Interface of an InN/p-GaN Heterojunction under Reverse Bias Voltage. Nanomaterials 2018, 8, 1039.
https://doi.org/10.3390/nano8121039
AMA Style
Svrcek V, Kolenda M, Kadys A, Reklaitis I, Dobrovolskas D, Malinauskas T, Lozach M, Mariotti D, Strassburg M, Tomašiūnas R.
Significant Carrier Extraction Enhancement at the Interface of an InN/p-GaN Heterojunction under Reverse Bias Voltage. Nanomaterials. 2018; 8(12):1039.
https://doi.org/10.3390/nano8121039
Chicago/Turabian Style
Svrcek, Vladimir, Marek Kolenda, Arunas Kadys, Ignas Reklaitis, Darius Dobrovolskas, Tadas Malinauskas, Mickael Lozach, Davide Mariotti, Martin Strassburg, and Roland Tomašiūnas.
2018. "Significant Carrier Extraction Enhancement at the Interface of an InN/p-GaN Heterojunction under Reverse Bias Voltage" Nanomaterials 8, no. 12: 1039.
https://doi.org/10.3390/nano8121039
APA Style
Svrcek, V., Kolenda, M., Kadys, A., Reklaitis, I., Dobrovolskas, D., Malinauskas, T., Lozach, M., Mariotti, D., Strassburg, M., & Tomašiūnas, R.
(2018). Significant Carrier Extraction Enhancement at the Interface of an InN/p-GaN Heterojunction under Reverse Bias Voltage. Nanomaterials, 8(12), 1039.
https://doi.org/10.3390/nano8121039