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Journal: Coatings, 2024
Volume: 14
Number: 555
Article:
Effects of Annealing Temperature on Bias Temperature Stress Stabilities of Bottom-Gate Coplanar In-Ga-Zn-O Thin-Film Transistors
Authors:
by
Yuyun Chen, Yi Shen, Yuanming Chen, Guodong Xu, Yudong Liu and Rui Huang
Link:
https://www.mdpi.com/2079-6412/14/5/555
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