Order Article Reprints

Kim Y, Seon Y, Kim S, Kim J, Bae S, Yang I, Yoo C, Ham J, Hong J, Jeon J. Analytical Current–Voltage Modeling and Analysis of the MFIS Gate-All-Around Transistor Featuring Negative-Capacitance. Electronics. 2021; 10(10):1177. https://doi.org/10.3390/electronics10101177

Kim, Yeji, Yoongeun Seon, Soowon Kim, Jongmin Kim, Saemin Bae, Inkyung Yang, Changhyun Yoo, Junghoon Ham, Jungmin Hong, and Jongwook Jeon. 2021. "Analytical Current–Voltage Modeling and Analysis of the MFIS Gate-All-Around Transistor Featuring Negative-Capacitance" Electronics 10, no. 10: 1177. https://doi.org/10.3390/electronics10101177

Kim, Y., Seon, Y., Kim, S., Kim, J., Bae, S., Yang, I., Yoo, C., Ham, J., Hong, J., & Jeon, J. (2021). Analytical Current–Voltage Modeling and Analysis of the MFIS Gate-All-Around Transistor Featuring Negative-Capacitance. Electronics, 10(10), 1177. https://doi.org/10.3390/electronics10101177