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Volume 10
Issue 19
10.3390/electronics10192446
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Article

RF Pogo-Pin Probe Card Design Aimed at Automated Millimeter-Wave Multi-Port Integrated-Circuit Testing

by
K. M. Lee
1,
J. H. Oh
2,
M. S. Kim
2,
T. S. Kim
2 and
M. Kim
1,*
1
School of Electrical Engineering, Korea University, Seoul 02841, Korea
2
Samsung Electronics Co., Ltd., Suwon 16677, Korea
*
Author to whom correspondence should be addressed.
Electronics 2021, 10(19), 2446; https://doi.org/10.3390/electronics10192446
Submission received: 4 August 2021 / Revised: 1 October 2021 / Accepted: 5 October 2021 / Published: 8 October 2021
(This article belongs to the Section Microwave and Wireless Communications)
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Abstract

A prototype RF probe card is assembled to test the feasibility of Pogo-pins as robust probe tips for the automized testing of multiple-port millimeter-wave circuits. A custom-made ceramic housing machined from a low-loss dielectric holds an array of 157 Pogo-pins, each with 2.9 mm-length in fixed positions. The ceramic housing is then mounted onto a probe-card PCB for power-loss measurements on two signal-ground Pogo-pin connections arbitrarily selected from the array. The probing results on a test circuit with a simple thru-line indicate a successful power transfer with a small insertion loss of less than 0.5 dB per single Pogo-pin connection up to 25 GHz. A new probe card design using shorter Pogo-pins is being prepared to extend the operation frequency to beyond 40 GHz.
Keywords: RF probe cards; Pogo-pin probes; automized RF testing RF probe cards; Pogo-pin probes; automized RF testing

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MDPI and ACS Style

Lee, K.M.; Oh, J.H.; Kim, M.S.; Kim, T.S.; Kim, M. RF Pogo-Pin Probe Card Design Aimed at Automated Millimeter-Wave Multi-Port Integrated-Circuit Testing. Electronics 2021, 10, 2446. https://doi.org/10.3390/electronics10192446

AMA Style

Lee KM, Oh JH, Kim MS, Kim TS, Kim M. RF Pogo-Pin Probe Card Design Aimed at Automated Millimeter-Wave Multi-Port Integrated-Circuit Testing. Electronics. 2021; 10(19):2446. https://doi.org/10.3390/electronics10192446

Chicago/Turabian Style

Lee, K. M., J. H. Oh, M. S. Kim, T. S. Kim, and M. Kim. 2021. "RF Pogo-Pin Probe Card Design Aimed at Automated Millimeter-Wave Multi-Port Integrated-Circuit Testing" Electronics 10, no. 19: 2446. https://doi.org/10.3390/electronics10192446

APA Style

Lee, K. M., Oh, J. H., Kim, M. S., Kim, T. S., & Kim, M. (2021). RF Pogo-Pin Probe Card Design Aimed at Automated Millimeter-Wave Multi-Port Integrated-Circuit Testing. Electronics, 10(19), 2446. https://doi.org/10.3390/electronics10192446

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