Next Article in Journal
EVeREst: Bitrate Adaptation for Cloud VR
Next Article in Special Issue
Study and Assessment of Defect and Trap Effects on the Current Capabilities of a 4H-SiC-Based Power MOSFET
Previous Article in Journal
Design Topologies of a CMOS Charge Pump Circuit for Low Power Applications
Previous Article in Special Issue
Investigation of Electrical Contacts to p-Grid in SiC Power Devices Based on Charge Storage Effect and Dynamic Degradation
 
 
Article

Article Versions Notes

Electronics 2021, 10(6), 677; https://doi.org/10.3390/electronics10060677
Action Date Notes Link
article pdf uploaded. 13 March 2021 14:57 CET Version of Record https://www.mdpi.com/2079-9292/10/6/677/pdf-vor
article xml file uploaded 15 March 2021 07:34 CET Original file -
article xml uploaded. 15 March 2021 07:34 CET Update https://www.mdpi.com/2079-9292/10/6/677/xml
article pdf uploaded. 15 March 2021 07:34 CET Updated version of record https://www.mdpi.com/2079-9292/10/6/677/pdf
article html file updated 15 March 2021 07:35 CET Original file -
article html file updated 25 July 2022 07:33 CEST Update https://www.mdpi.com/2079-9292/10/6/677/html
Back to TopTop