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Journal: Electronics, 2022
Volume: 11
Number: 135

Article: SRAM-Based PUF Reliability Prediction Using Cell-Imbalance Characterization in the State Space Diagram
Authors: by Gabriel Torrens, Abdel Alheyasat, Bartomeu Alorda and Sebastià A. Bota
Link: https://www.mdpi.com/2079-9292/11/1/135

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