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Journal: Electronics, 2022
Volume: 11
Number: 2043
Article:
TAISAM: A Transistor Array-Based Test Method for Characterizing Heavy Ion-Induced Sensitive Areas in Semiconductor Materials
Authors:
by
Jinjin Shao, Ruiqiang Song, Yaqing Chi, Bin Liang and Zhenyu Wu
Link:
https://www.mdpi.com/2079-9292/11/13/2043
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