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Article

Self-Supervised Learning for Time-Series Anomaly Detection in Industrial Internet of Things

Department of Electronics Engineering, Kookmin University, Seoul 02707, Korea
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Author to whom correspondence should be addressed.
Electronics 2022, 11(14), 2146; https://doi.org/10.3390/electronics11142146
Submission received: 10 June 2022 / Revised: 22 June 2022 / Accepted: 5 July 2022 / Published: 8 July 2022
(This article belongs to the Section Artificial Intelligence)

Abstract

Industrial sensors have presently emerged as a very important device for monitoring environmental conditions in the manufacturing system. However, abnormal behavior of these smart sensors may cause some failure or potential risk during system operation, thereby increasing the high availability of the entire manufacturing process. An anomaly detection tool in industrial monitoring system must detect any abnormal behavior in advance. Recently, self-supervised learning demonstrated comparable performance with other methods while eliminating manually labeled processes in training. Moreover, this technique decreases the complexity of the training model in lightweight devices to increase the processing time and detect accurately the health of equipment assets. Therefore, this paper proposes an anomaly detection method using a self-supervised learning framework in a time-series dataset to improve the model performance in terms of high accuracy and lightweight method. With the consideration of time-series data augmentation for generating pseudo-label, a classifier using one-dimension convolutional neural network (1DCNN) is applied to learn the characteristics of normal data. This classification model output will effectively measure the degree of abnormality. The experimental results indicate that our proposed method outperforms classic anomaly detection methods. Furthermore, the model deployment in a real testbed is performed to illustrate the efficiency of the self-supervised learning method for time-series anomaly detection.
Keywords: anomaly detection; self-supervised learning; edge computing anomaly detection; self-supervised learning; edge computing

Share and Cite

MDPI and ACS Style

Tran, D.H.; Nguyen, V.L.; Nguyen, H.; Jang, Y.M. Self-Supervised Learning for Time-Series Anomaly Detection in Industrial Internet of Things. Electronics 2022, 11, 2146. https://doi.org/10.3390/electronics11142146

AMA Style

Tran DH, Nguyen VL, Nguyen H, Jang YM. Self-Supervised Learning for Time-Series Anomaly Detection in Industrial Internet of Things. Electronics. 2022; 11(14):2146. https://doi.org/10.3390/electronics11142146

Chicago/Turabian Style

Tran, Duc Hoang, Van Linh Nguyen, Huy Nguyen, and Yeong Min Jang. 2022. "Self-Supervised Learning for Time-Series Anomaly Detection in Industrial Internet of Things" Electronics 11, no. 14: 2146. https://doi.org/10.3390/electronics11142146

APA Style

Tran, D. H., Nguyen, V. L., Nguyen, H., & Jang, Y. M. (2022). Self-Supervised Learning for Time-Series Anomaly Detection in Industrial Internet of Things. Electronics, 11(14), 2146. https://doi.org/10.3390/electronics11142146

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