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Journal: Electronics, 2022
Volume: 11
Number: 1115

Article: Using Enhanced Test Systems Based on Digital IC Test Model for the Improvement of Test Yield
Authors: by Chung-Huang Yeh, Jwu-E Chen, Chia-Jui Chang and Tse-Chia Huang
Link: https://www.mdpi.com/2079-9292/11/7/1115

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