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Journal: Electronics, 2023
Volume: 12
Number: 3198

Article: Soft-Error-Aware Radiation-Hardened Ge-DLTFET-Based SRAM Cell Design
Authors: by Pushpa Raikwal, Prashant Kumar, Meena Panchore, Pushpendra Dwivedi and Kanchan Cecil
Link: https://www.mdpi.com/2079-9292/12/14/3198

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