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Journal: Electronics, 2024
Volume: 13
Number: 1913
Article:
Test Coverage in Microservice Systems: An Automated Approach to E2E and API Test Coverage Metrics
Authors:
by
Amr S. Abdelfattah, Tomas Cerny, Jorge Yero, Eunjee Song and Davide Taibi
Link:
https://www.mdpi.com/2079-9292/13/10/1913
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