Next Article in Journal
Image Enhancement of Steel Plate Defects Based on Generative Adversarial Networks
Next Article in Special Issue
Temperature Dependence of Total Ionizing Dose Effects of β-Ga2O3 Schottky Barrier Diodes
Previous Article in Journal
Performance Evaluation of Parallel Graphs Algorithms Utilizing Graphcore IPU
Previous Article in Special Issue
Model Parameters and Degradation Mechanism Analysis of Indium Phosphide Hetero-Junction Bipolar Transistors Exposed to Proton Irradiation
 
 
Article

Article Versions Notes

Electronics 2024, 13(11), 2012; https://doi.org/10.3390/electronics13112012
Action Date Notes Link
article xml file uploaded 22 May 2024 04:26 CEST Original file -
article xml uploaded. 22 May 2024 04:26 CEST Update https://www.mdpi.com/2079-9292/13/11/2012/xml
article pdf uploaded. 22 May 2024 04:26 CEST Version of Record https://www.mdpi.com/2079-9292/13/11/2012/pdf
article html file updated 22 May 2024 04:28 CEST Original file https://www.mdpi.com/2079-9292/13/11/2012/html
Back to TopTop