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Article

A MCDM-Based Analysis Method of Testability Allocation for Multi-Functional Integrated RF System

by
Chao Zhang
1,2,*,
Yiyang Huang
1,
Dingyu Zhou
3,
Zhijie Dong
4,*,
Shilie He
1,5 and
Zhenwei Zhou
5
1
Department of Integrated Technology and Control Engineering, School of Aeronautics, Northwestern Polytechnical University, Xi’an 710072, China
2
National Key Laboratory of Aircraft Design, Xi’an 710072, China
3
Shanghai Civil Aviation Control and Navigation System Co., Ltd., Shanghai 201100, China
4
The 6th Research Institute of China Electronics Corporation, Beijing 100083, China
5
China Electronic Product Reliability and Environmental Testing Institute, Guangzhou 510610, China
*
Authors to whom correspondence should be addressed.
Electronics 2024, 13(18), 3618; https://doi.org/10.3390/electronics13183618
Submission received: 19 August 2024 / Revised: 6 September 2024 / Accepted: 9 September 2024 / Published: 12 September 2024
(This article belongs to the Special Issue Reliability, Fault Tolerance and Safety of Electronic Devices and Systems)
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Abstract

The multi-functional integrated RF system (MIRFS) is a crucial component of aircraft onboard systems. In the testability design process, traditional methods cannot effectively deal with the inevitable differences between system designs and usage requirements. By considering the MIRFS’s full lifecycle characteristics, a new testability allocation method based on multi-criteria decision-making (MCDM) is proposed in this paper. Firstly, the testability framework was constructed and more than 100 indicators were given, which included both different system-level and inter-system indicators. Secondly, to manage parameter diversity and calculate complexity, the basic 12 testability indicators were optimized through the Analytic Hierarchy Process and Technique for Order Preference by Similarity to Ideal Solution (AHP-TOPSIS) method. Thirdly, the detailed testability parameters were obtained by using the Decision-Making Trial and Evaluation Laboratory and Analytic Network Process (DEMATEL-ANP) to reduce the subjectivity and uncertainty. Finally, an example was utilized, and the results show that the MCDM method is significantly better than traditional methods in terms of accuracy and effectiveness, which will provide a more scientific basis for the MIRFS testability design process.
Keywords: multi-functional integrated RF system; testability allocation; DEMATEL; analytic network process multi-functional integrated RF system; testability allocation; DEMATEL; analytic network process

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MDPI and ACS Style

Zhang, C.; Huang, Y.; Zhou, D.; Dong, Z.; He, S.; Zhou, Z. A MCDM-Based Analysis Method of Testability Allocation for Multi-Functional Integrated RF System. Electronics 2024, 13, 3618. https://doi.org/10.3390/electronics13183618

AMA Style

Zhang C, Huang Y, Zhou D, Dong Z, He S, Zhou Z. A MCDM-Based Analysis Method of Testability Allocation for Multi-Functional Integrated RF System. Electronics. 2024; 13(18):3618. https://doi.org/10.3390/electronics13183618

Chicago/Turabian Style

Zhang, Chao, Yiyang Huang, Dingyu Zhou, Zhijie Dong, Shilie He, and Zhenwei Zhou. 2024. "A MCDM-Based Analysis Method of Testability Allocation for Multi-Functional Integrated RF System" Electronics 13, no. 18: 3618. https://doi.org/10.3390/electronics13183618

APA Style

Zhang, C., Huang, Y., Zhou, D., Dong, Z., He, S., & Zhou, Z. (2024). A MCDM-Based Analysis Method of Testability Allocation for Multi-Functional Integrated RF System. Electronics, 13(18), 3618. https://doi.org/10.3390/electronics13183618

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