Deep Learning in the Phase Extraction of Electronic Speckle Pattern Interferometry
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Jiang, W.; Ren, T.; Fu, Q. Deep Learning in the Phase Extraction of Electronic Speckle Pattern Interferometry. Electronics 2024, 13, 418. https://doi.org/10.3390/electronics13020418
Jiang W, Ren T, Fu Q. Deep Learning in the Phase Extraction of Electronic Speckle Pattern Interferometry. Electronics. 2024; 13(2):418. https://doi.org/10.3390/electronics13020418
Chicago/Turabian StyleJiang, Wenbo, Tong Ren, and Qianhua Fu. 2024. "Deep Learning in the Phase Extraction of Electronic Speckle Pattern Interferometry" Electronics 13, no. 2: 418. https://doi.org/10.3390/electronics13020418
APA StyleJiang, W., Ren, T., & Fu, Q. (2024). Deep Learning in the Phase Extraction of Electronic Speckle Pattern Interferometry. Electronics, 13(2), 418. https://doi.org/10.3390/electronics13020418