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Article

Robust Twin Extreme Learning Machine Based on Soft Truncated Capped L1-Norm Loss Function

School of Mathematics and Information Sciences, North Minzu University, Yinchuan 750021, China
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Author to whom correspondence should be addressed.
Electronics 2024, 13(22), 4533; https://doi.org/10.3390/electronics13224533
Submission received: 13 October 2024 / Revised: 11 November 2024 / Accepted: 13 November 2024 / Published: 19 November 2024
(This article belongs to the Special Issue Advanced Control Strategies and Applications of Multi-Agent Systems)

Abstract

Currently, most researchers propose robust algorithms from different perspectives for overcoming the impact of outliers on a model, such as introducing loss functions. However, some loss functions often fail to achieve satisfactory results when the outliers are large. Therefore, the capped loss has become a better choice for researchers. The majority of researchers directly set an upper bound on the loss function, which reduces the impact of large outliers, but also introduces non-differentiable regions. To avoid this shortcoming, we propose a robust twin extreme learning machine based on a soft-capped L1-normal loss function (SCTELM). It uses a soft capped L1-norm loss function. This not only overcomes the shortcomings of the hard capped loss function, but also improves the robustness of the model. Simultaneously, to improve the learning efficiency of the model, the stochastic variance-reduced gradient (SVRG) optimization algorithm is used. Experimental results on several datasets show that the proposed algorithm can compete with state-of-the-art algorithms in terms of robustness.
Keywords: robustness; twin extreme learning machine; capped L1-norm; classification robustness; twin extreme learning machine; capped L1-norm; classification

Share and Cite

MDPI and ACS Style

Xu, Z.; Wei, B.; Yu, G.; Ma, J. Robust Twin Extreme Learning Machine Based on Soft Truncated Capped L1-Norm Loss Function. Electronics 2024, 13, 4533. https://doi.org/10.3390/electronics13224533

AMA Style

Xu Z, Wei B, Yu G, Ma J. Robust Twin Extreme Learning Machine Based on Soft Truncated Capped L1-Norm Loss Function. Electronics. 2024; 13(22):4533. https://doi.org/10.3390/electronics13224533

Chicago/Turabian Style

Xu, Zhendong, Bo Wei, Guolin Yu, and Jun Ma. 2024. "Robust Twin Extreme Learning Machine Based on Soft Truncated Capped L1-Norm Loss Function" Electronics 13, no. 22: 4533. https://doi.org/10.3390/electronics13224533

APA Style

Xu, Z., Wei, B., Yu, G., & Ma, J. (2024). Robust Twin Extreme Learning Machine Based on Soft Truncated Capped L1-Norm Loss Function. Electronics, 13(22), 4533. https://doi.org/10.3390/electronics13224533

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