Robust Twin Extreme Learning Machine Based on Soft Truncated Capped L1-Norm Loss Function
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Xu, Z.; Wei, B.; Yu, G.; Ma, J. Robust Twin Extreme Learning Machine Based on Soft Truncated Capped L1-Norm Loss Function. Electronics 2024, 13, 4533. https://doi.org/10.3390/electronics13224533
Xu Z, Wei B, Yu G, Ma J. Robust Twin Extreme Learning Machine Based on Soft Truncated Capped L1-Norm Loss Function. Electronics. 2024; 13(22):4533. https://doi.org/10.3390/electronics13224533
Chicago/Turabian StyleXu, Zhendong, Bo Wei, Guolin Yu, and Jun Ma. 2024. "Robust Twin Extreme Learning Machine Based on Soft Truncated Capped L1-Norm Loss Function" Electronics 13, no. 22: 4533. https://doi.org/10.3390/electronics13224533
APA StyleXu, Z., Wei, B., Yu, G., & Ma, J. (2024). Robust Twin Extreme Learning Machine Based on Soft Truncated Capped L1-Norm Loss Function. Electronics, 13(22), 4533. https://doi.org/10.3390/electronics13224533