A Low-Reflection Tuning Strategy for Three-Stub Waveguides
and Yang Yang 1,*
Didier Stuerga
Round 1
Reviewer 1 Report
Comments and Suggestions for AuthorsThis paper introduced a low-reflection adjustment strategy for a three-stub waveguide, which can effectively suppress the increase of reflection during the tuning. The main features of this proposed strategy is extensive field analysis performance. The paper is presented in an appropriate manner and is well-organized. Professionals handle the design, simulation, and experimental validation.
I recommend the authors to add a performance comparison with previously published work.
Author Response
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Response 1: Thank you for your helpful suggestions. We have added a comparison table and compared it from the following aspects.
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Author Response File: 
Author Response.pdf
Reviewer 2 Report
Comments and Suggestions for AuthorsIn this paper, authors have presented the low reflection tuning method for three stub waveguides. Simulated, computed and measured results have been presented and discussed. The results confirm that the proposed method is able to avoid the large reflection in the case of load mutation. Following are the suggestions to the authors:
1. Though ‘EM’ is commonly used abbreviation, I suggest to please define the abbreviation ‘EM’ in the abstract.
2. At the end of the introduction section, the organization of the paper should be included.
3. Which software has been used for simulating the model?
4. Page 3: The symbol ‘Xc’ in the text seems in different style from the equation. Please cjeck.
5. The quality of graphs in Fig. 3 should be improved.
6. Please include a comparison table at the end of the section 4 (for highlighting the key features of the proposed method as compared to the existing methods such as in ref [20], [21], [22], [23] etc.
Comments on the Quality of English LanguageMinor editing of English language required.
Author Response
Response 1: Thank you for your helpful suggestions. We have defined "EM" in the abstract.
Response 2: Thank you for your helpful suggestions. We have added the organization of the article at the end of the introduction.
Response 3: Thank you for your question. We use HFSS to conduct electromagnetic simulation on the model to verify the effectiveness of the proposed theory and algorithm.
Response 4: Sorry for our negligence. We have revised the formatting issue.
Response 5: Sorry for our negligence. We have increased the quality of the images.
Response 6: Thank you for your helpful suggestions. We have added a comparison table to compare with previous work.
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References |
Number of stubs |
High accuracy |
Need iterative or fine algorithm? |
Tuned S11(dB) |
Optimal S11(dB) |
Year |
|
[20] |
4 |
No |
Yes |
≤-10 |
N.A. |
2004 |
|
[21] |
3 |
No |
Yes |
≤-20 |
-22.2 |
1996 |
|
[22] |
3 |
No |
Yes |
≤-21 |
-28.2 |
2019 |
|
[23] |
4 |
Yes |
Yes |
≤-35 |
-40 |
2006 |
|
[24] |
3 |
No |
No |
N.A. |
-18.1 |
2020 |
|
This work |
3 |
Yes |
No |
≤-15 |
-30 |
2024 |
Author Response File: Author Response.pdf
Reviewer 3 Report
Comments and Suggestions for AuthorsIt is not clear to see what are the novelty and technical contributions of this manuscript. Please highlight them clearly with impact for waveguide device designs. In Table 2. Measured load value, what is the definition for Measured load value (Ω) and Measured equivalent load value (Ω)? What can be observed from this Table 2? Please define calculated and simulated results also. Stub and stub port? Please show a real application if possible.
Author Response
Please see the attachment
Author Response File: Author Response.pdf
Reviewer 4 Report
Comments and Suggestions for AuthorsThis publication describes a procedure for ensuring impedance matching of a waveguide. The objective is not to propose a new approach to stub adaptation but rather a rapid and efficient cavity retuning procedure. The procedure is clearly described. Some practical examples are presented.
We can regret a glaring lack which is the dynamic capacity of the procedure to follow significant and especially rapid load variations, such as thermal runaway.
Author Response
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Response 1: Thank you for your comments. It is indeed difficult to achieve real-time tracking and matching for rapid load variations. The impedance matching algorithm proposed in this paper does not require iterative or fine tuning algorithms, and can directly and accurately calculate the optimal depth of the stubs, greatly reducing the complexity of the program. Through programming and testing, the program can complete calculations within 0.1 seconds, so the program can quickly respond to rapid load variations. However, the automatic adjustment of the stubs needs to be completed by controlling the motors, and the rotation of the motors requires a certain amount of time, which may be the main reason for the long impedance matching time.
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Author Response File: Author Response.pdf
Round 2
Reviewer 2 Report
Comments and Suggestions for AuthorsAuthors have addressed most of the comments. Following are the suggestions to the authors:
1. In the abstract, 'EM (Electromagnetic)' should be written as 'Electromagnetic (EM)'.
2. The citation of Figure 1 is missing in the text. Also, please check for other figures and subfigures.
3. The quality of some figures such as Fig. 7, Fig. 9, Fig. 13, Fig. 18, Fig. 19, Fig. 20 etc should be improved.
4. At some places, equation numbering is not properly aligned.
Author Response
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Response 1: Thank you for your helpful suggestions. We have made a modification to it.
Response 2: Thank you for your helpful suggestions. Sorry for our negligence. We have added a citation of Figure 1. We have checked other figures and made modifications to them.
Response 3: Thank you for your helpful suggestions. We have strengthened the quality of the images.
Response 4: Sorry for our negligence. We have revised the formatting issue. |
Author Response File: Author Response.pdf
Reviewer 3 Report
Comments and Suggestions for AuthorsThe quality of this revised version of manuscript has been improved. It is acceptable for publication.
Author Response
Thank you very much for reviewing our manuscript.
