Alberton, S.G.; Aguiar, V.A.P.; Added, N.; Vilas-Bôas, A.C.; Guazzelli, M.A.; Wyss, J.; Silvestrin, L.; Mattiazzo, S.; Pereira, M.S.; Finco, S.;
et al. Ion-Induced Charge and Single-Event Burnout in Silicon Power UMOSFETs. Electronics 2025, 14, 2288.
https://doi.org/10.3390/electronics14112288
AMA Style
Alberton SG, Aguiar VAP, Added N, Vilas-Bôas AC, Guazzelli MA, Wyss J, Silvestrin L, Mattiazzo S, Pereira MS, Finco S,
et al. Ion-Induced Charge and Single-Event Burnout in Silicon Power UMOSFETs. Electronics. 2025; 14(11):2288.
https://doi.org/10.3390/electronics14112288
Chicago/Turabian Style
Alberton, Saulo G., Vitor A. P. Aguiar, Nemitala Added, Alexis C. Vilas-Bôas, Marcilei A. Guazzelli, Jeffery Wyss, Luca Silvestrin, Serena Mattiazzo, Matheus S. Pereira, Saulo Finco,
and et al. 2025. "Ion-Induced Charge and Single-Event Burnout in Silicon Power UMOSFETs" Electronics 14, no. 11: 2288.
https://doi.org/10.3390/electronics14112288
APA Style
Alberton, S. G., Aguiar, V. A. P., Added, N., Vilas-Bôas, A. C., Guazzelli, M. A., Wyss, J., Silvestrin, L., Mattiazzo, S., Pereira, M. S., Finco, S., Paccagnella, A., & Medina, N. H.
(2025). Ion-Induced Charge and Single-Event Burnout in Silicon Power UMOSFETs. Electronics, 14(11), 2288.
https://doi.org/10.3390/electronics14112288
