Zhang, R.; Jiang, H.; Wang, W.; Liu, J.
Optimization Methods, Challenges, and Opportunities for Edge Inference: A Comprehensive Survey. Electronics 2025, 14, 1345.
https://doi.org/10.3390/electronics14071345
AMA Style
Zhang R, Jiang H, Wang W, Liu J.
Optimization Methods, Challenges, and Opportunities for Edge Inference: A Comprehensive Survey. Electronics. 2025; 14(7):1345.
https://doi.org/10.3390/electronics14071345
Chicago/Turabian Style
Zhang, Runhua, Hongxu Jiang, Wei Wang, and Jinhao Liu.
2025. "Optimization Methods, Challenges, and Opportunities for Edge Inference: A Comprehensive Survey" Electronics 14, no. 7: 1345.
https://doi.org/10.3390/electronics14071345
APA Style
Zhang, R., Jiang, H., Wang, W., & Liu, J.
(2025). Optimization Methods, Challenges, and Opportunities for Edge Inference: A Comprehensive Survey. Electronics, 14(7), 1345.
https://doi.org/10.3390/electronics14071345