Far Field Extrapolation from Near Field Interactions and Shielding Influence Investigations Based on a FE-PEEC Coupling Method
Abstract
:1. Introduction
2. EMC Study of Static Converters
3. State of the Art on Modeling Methods
3.1. Usual Methods
3.2. Hybrid Method
- Close to the conductors, variations of magnetic field is very important [19], so to take this aspect into account, the meshing must be dense;
- Geometry of conductors is very hard to mesh with a good quality since it can be constituted by very this planes like DBC (Direct Copper Board).
- PEEC method easily takes into account interactions between complex 3D massive conductors;
- FEM takes the interaction between conductors and ferromagnetic materials into account.
4. Application and Results
4.1. Studied Structure
4.2. Results
Currents without filter (A) | U | V | W |
328.628 | 373.487 | 403.316 | |
Currents with filter (A) | U | V | W |
Without shielding (A) | 465.60 | 527.09 | 570.53 |
With shielding (A) | 465.59 | 527.04 | 570.48 |
4.3. Conclusions
5. Conclusion
References
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Clavel, E.; Tran, T.-S.; Aimé, J.; Meunier, G.; Roudet, J. Far Field Extrapolation from Near Field Interactions and Shielding Influence Investigations Based on a FE-PEEC Coupling Method. Electronics 2013, 2, 80-93. https://doi.org/10.3390/electronics2010080
Clavel E, Tran T-S, Aimé J, Meunier G, Roudet J. Far Field Extrapolation from Near Field Interactions and Shielding Influence Investigations Based on a FE-PEEC Coupling Method. Electronics. 2013; 2(1):80-93. https://doi.org/10.3390/electronics2010080
Chicago/Turabian StyleClavel, Edith, Thanh-Son Tran, Jérémie Aimé, Gérard Meunier, and James Roudet. 2013. "Far Field Extrapolation from Near Field Interactions and Shielding Influence Investigations Based on a FE-PEEC Coupling Method" Electronics 2, no. 1: 80-93. https://doi.org/10.3390/electronics2010080
APA StyleClavel, E., Tran, T.-S., Aimé, J., Meunier, G., & Roudet, J. (2013). Far Field Extrapolation from Near Field Interactions and Shielding Influence Investigations Based on a FE-PEEC Coupling Method. Electronics, 2(1), 80-93. https://doi.org/10.3390/electronics2010080