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Journal: Electronics, 2018
Volume: 7
Number: 227
Article:
Simulation Analysis in Sub-0.1 ?m for Partial Isolation Field-Effect Transistors
Authors:
by
Young Kwon Kim, Jin Sung Lee, Geon Kim, Taesik Park, HuiJung Kim, Young Pyo Cho, Young June Park and Myoung Jin Lee
Link:
https://www.mdpi.com/2079-9292/7/10/227
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