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Journal: Electronics, 2019
Volume: 8
Number: 1531
Article:
SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA
Authors:
by
Chang Cai, Shuai Gao, Peixiong Zhao, Jian Yu, Kai Zhao, Liewei Xu, Dongqing Li, Ze He, Guangwen Yang, Tianqi Liu and Jie Liu
Link:
https://www.mdpi.com/2079-9292/8/12/1531
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